Control of heterogeneous ice nucleation (HIN) is critical
for applications
that range from iceophobic surfaces to ice-templated materials. HIN
on 2D materials is a particular interesting topic that still lacks
extensive experimental investigations. Here, we focus on the HIN on
single-layer graphene (SLG) transferred onto different substrates,
including silicon, silica, and thermal oxide on silicon. Complemented
by other samples without SLG, we obtain a large range of wetting contact
angles (WCAs) from 2° to 95°. All pristine SLG samples exhibit
a large contact angle of ∼95°, which is close to the theoretical
value of 96° for free-standing SLG, irrespective of the substrate
and even in the presence of nanoscale wrinkles on SLG, which are due
to the transfer process, indicating that the topographical features
have little impact on the wetting behavior. Interestingly, SLG displays
changes in hydrophobicity upon repeated water droplet freezing–melting–drying
cycles due to a shift in Fermi level and/or enhanced water–substrate
polar molecular interactions, likely induced by residual adsorption
of H2O molecules. We found that a 0.04 eV decrease in SLG
Fermi level reduces the SLG/water interface energy by ∼6 mJ/m2, thereby making SLG less hydrophobic. Counterintuitively,
the reduction in SLG/water interface energy and the enhanced hydrophilicity
after repeated freezing–melting–evaporation cycles actually
decreases the freezing temperature by ∼3–4 °C,
thereby slightly retarding rather than enhancing HIN. We also found
that the water droplet freezing temperature differed by only ∼1
°C on different substrates with WCAs from 2° to 95°,
an intriguing and yet reasonable result that confirms that wettability
alone is not a good indicator of HIN capability.
The HIN rate is rather determined by the difference between substrate/water and substrate/ice interface energies, which
was found to stay almost constant for substrates weakly interacting
with water/ice via van der Waals or hydrogen bonds, irrespective of
hydrophilicity.