Temperature-dependent resistive switching characteristics for Au/n-type CuAlOx/heavily doped p-type Si devices

Lin, Yow Jon; Chu, Yu Ju

doi:10.1016/j.microrel.2016.05.012

Microelectronics Reliability

2016

DOI: 10.1016/j.microrel.2016.05.012

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Temperature-dependent resistive switching characteristics for Au/n-type CuAlOx/heavily doped p-type Si devices

Yow Jon Lin

Yu Ju Chu

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Temperature-dependent resistive switching characteristics for Au/n-type CuAlOx/heavily doped p-type Si devices

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References 36 publications

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