“…The insets of Diagrams (c) and (d) show the noise bands in the dark and under illumination to be smaller than 1 mV, which is the state-of-the-art for SPV measurements using unmodulated illumination schemes. The subsequent relaxation in the dark can be seen in Diagrams (e) and (f) and was recorded over a time span of about 20 h. In a typical full SPV analysis, comparative datasets of such light-on and light-off transients would be collected for a number of relevant wavelengths under varied light intensity and/or temperature to be processed using one or more mathematical models (see, e.g., [ 27 , 28 , 29 , 30 ], or for a comparative summary, [ 31 ]) to extract a number of material parameters such as capture cross-sections for photons and electrons, activation energies of trap states, or surface/interface band bendings in the dark and under illumination. Prior to the time-consuming acquisition of transients, surface photovoltage spectra, i.e., the SPV as a function of wavelength, are usually recorded in order to select meaningful wavelengths for the recording of transients.…”