Temperature dependence of the short circuit current and spectral responsivity of various kinds of crystalline silicon photovoltaic devices

Abstract

The short-circuit current I sc and spectral responsivity (SR) of crystalline silicon (c-Si) photovoltaic (PV) modules and cells are investigated at various device temperatures. The long-wavelength tail of SR shifts toward longer wavelengths as the temperature increases. Although the wavelength shift Δλ per temperature difference ΔT is dependent on the device structure and λ, the present results show that the shift in the quantum efficiency (QE), which is related to SR by QE ? SR ' 1240/λ, can be approximated using the wavelength-independent constant of Δλ/ ΔT > 0.45 nm/K for various types of c-Si device. The results indicate that the temperature dependence of SR can be approximated using a simple relation for various types of c-Si PV device, which greatly improves the precision of spectral mismatch correction when SR at only one temperature is available. © 2018 The Japan Society of Applied Physics -b) -b) Reference cell (mono) a) temporary value b) not specified

Determining the optimal standard test condition correction procedure for high‐throughput field I–V measurements of photovoltaic modules

“…Among the existing three temperature coefficients (α, β, and γ), the uncertainty in estimation of short-circuit current temperature coefficient (α) is likely to be highest due to following reasons 24,25 :…”

“…To avoid this, spectral mismatch correction should be performed by considering the variation of SR with temperature. 25 The effect of uncertainties in the temperature coefficients of P max , V oc , and I sc on the errors in STC correction of various procedures is being investigated by the authors.…”

“…Among the existing three temperature coefficients ( α , β , and γ ), the uncertainty in estimation of short‐circuit current temperature coefficient ( α ) is likely to be highest due to following reasons 24,25 : (i) spectral irradiance mismatch with respect to reference AM1.5G spectrum of STC and (ii) mismatch in the spectral response (SR) between reference device and the device under test. Even though the absolute value of α (~+0.05%/°C for c‐Si technology) is very small, large uncertainties in it will lead to reasonable errors in STC correction of various performance parameters.…”

“…Even though the absolute value of α (~+0.05%/°C for c‐Si technology) is very small, large uncertainties in it will lead to reasonable errors in STC correction of various performance parameters. To avoid this, spectral mismatch correction should be performed by considering the variation of SR with temperature 25 . The effect of uncertainties in the temperature coefficients of P max , V oc , and I sc on the errors in STC correction of various procedures is being investigated by the authors.…”

Temperature coefficients of degraded crystalline silicon photovoltaic modules at outdoor conditions

“…Sometimes, the values for α obtained indoors can differ from the ones obtained outdoors 11,12 . This is due to the temperature dependency of the spectral response of c‐Si, 13 implying a change of spectral mismatch. However, these coefficients can be measured using simulated light following the work by Salis et al 14 …”