2006
DOI: 10.1109/led.2006.880644
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Temperature-Compensated Devices Using Thin$hboxTeO_2$Layer With Negative TCD

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Cited by 7 publications
(9 citation statements)
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“…Previously reported results show that in comparison to SiO 2 , TeO 3 thin films possess high value of negative TCD [18,20,21,30,31]. So, with the integration of relatively less thick TeO 3 over layer, a positive TCD device can be made temperature stable [18,19]. Therefore, in the present study, the result of adding TeO 3 over layer over BeO/128 • YX LiNbO 3 bilayer structure on its SAW propagation characteristics have been investigated further.…”
Section: Resultsmentioning
confidence: 84%
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“…Previously reported results show that in comparison to SiO 2 , TeO 3 thin films possess high value of negative TCD [18,20,21,30,31]. So, with the integration of relatively less thick TeO 3 over layer, a positive TCD device can be made temperature stable [18,19]. Therefore, in the present study, the result of adding TeO 3 over layer over BeO/128 • YX LiNbO 3 bilayer structure on its SAW propagation characteristics have been investigated further.…”
Section: Resultsmentioning
confidence: 84%
“…The positive TCD BeO/128 • YX LiNbO 3 bilayer structure can be made temperature stable by integrating it with an over layer (i.e., SiO 2 and TeO 3 ) possessing negative TCD [21,[29][30][31]. Previously reported results show that in comparison to SiO 2 , TeO 3 thin films possess high value of negative TCD [18,20,21,30,31]. So, with the integration of relatively less thick TeO 3 over layer, a positive TCD device can be made temperature stable [18,19].…”
Section: Resultsmentioning
confidence: 95%
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“…Efforts have been made by various workers towards the measurement of TCD of layered structures based on LiNbO 3 [3,7]. Silicon dioxide (SiO 2 ) and tellurium dioxide (TeO 2 ) are the two known materials that could be used as a temperature compensation layer due to their negative TCD characteristics [3,8,9]. Limited studies have been done on the temperature stability of the diamond based layered structure using an SiO 2 layer [1,10].…”
Section: Introductionmentioning
confidence: 99%