Sixteenth International Symposium on Quality Electronic Design 2015
DOI: 10.1109/isqed.2015.7085426
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Temperature aware refresh for DRAM performance improvement in 3D ICs

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Cited by 7 publications
(11 citation statements)
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“…Second, factors extrinsic to the DRAM device that depend on environmental or operating conditions. The most common extrinsic factors are aging [111,147], data values [74], and temperature [51]. Extrinsic factors can introduce significant variability in the error patterns.…”
Section: Enabling Eden With Error Modelsmentioning
confidence: 99%
“…Second, factors extrinsic to the DRAM device that depend on environmental or operating conditions. The most common extrinsic factors are aging [111,147], data values [74], and temperature [51]. Extrinsic factors can introduce significant variability in the error patterns.…”
Section: Enabling Eden With Error Modelsmentioning
confidence: 99%
“…Under the high temperature, conventional device-level management techniques may cause significant waste in energy and reduction in memory bandwidth [6]. As a result, fine-grained thermal-aware management methods for HMCs [6,7,16,26] have attracted a lot research interests. For example, authors of [6,16] proposed to tune the refresh rate at DRAM-row-level.…”
Section: Introductionmentioning
confidence: 99%
“…For several years, there is no free and publicly accessible HMC simulators. Therefore, the academia depends on simulators designed for 2D DRAMs (e.g., DRAMSim [20]) [7] to study the architecture and function of 3D DRAMs including HMCs. However, these simulators cannot accurately simulate the function of HMCs since HMCs have a special communication protocol with the host processor.…”
Section: Introductionmentioning
confidence: 99%
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