TEM-cell and surface scan to identify the electromagnetic emission of integrated circuits

Ostermann, Timm; Deutschmann, Bernd

doi:10.1145/764808.764829

Cited by 14 publications

(10 citation statements)

References 1 publication

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“…With the increase of the integration density of the modern electrical and electronic systems, the analysis of electromagnetic interference (EMI) and electromagnetic compatibility (EMC) issues become one of the primary importance and unavoidable step during the design process [1][2][3][4][5][6][7]. This effect can be found in various stages of the different chains for example in the automotive vehicles or aeronautic engines [8][9][10][11][12].…”

Section: Introductionmentioning

confidence: 99%

Application of a Hybrid Model for the Susceptibility of Complex Form Metallic Wires Perturbed by Em Near-Field Radiated by Electronic Structures

Rajkumar¹,

Ravelo²,

Bensetti³

et al. 2012

PIER B

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Abstract-A modeling of the metallic wires susceptibility facing to the disturbances caused by electromagnetic (EM) near-field (NF) radiated by electronic structures in radio frequencies (RF) is introduced by using a hybrid method. This latter is based on the use of the given EM-data calculated or determined from the standard computation tools associated with basic analytical methods expressing the coupling voltages at the victim wire extremities and the EM-NF radiations. In difference to the classical methods based on the far-field radiations, the main benefit of this method lies on the possibility to take into account the evanescent waves from the disturbing elements. The basic principle illustrating the hybrid method principle is explained. To verify the relevance of the method proposed, we consider a metallic wire having cm-length above the ground plane disturbed by the EM-near-waves from the electronic circuits in proximity. For that, we model the EM radiation of the disturbing electronic circuits and then, apply the hybrid method to evaluate the coupling voltages induced through the wires. By considering the radiations around hundreds MHz, we demonstrate that the hybrid method proposed enables us to generate voltages in good agreement with the simulations performed with the commercial tools. Two types of realistic configurations are studied. First, with a microstrip loop circuit radiating at about 0.7 GHz, we calculated induced voltages at the extremities of the structures. Then, the same analysis was made with a 3D-model coil self for the large band from 0.1 GHz to 0.5 GHz. The results are in good accordance between the terminal voltages of the wire. The relative error in the second configuration falls less than 10%. This investigation is important for the EM compatibility (EMC) analysis of the radiating coupling between wires and complex electrical and electronic systems disturbed by RF harmonics.

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Section: Introductionmentioning

confidence: 99%

Application of a Hybrid Model for the Susceptibility of Complex Form Metallic Wires Perturbed by Em Near-Field Radiated by Electronic Structures

Rajkumar¹,

Ravelo²,

Bensetti³

et al. 2012

PIER B

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show abstract

“…With the emergence of the hybrid technology integrated with multifunction, the issues related to the electromagnetic interference (EMI) [1][2][3][4][5][6][7][8][9] and electromagnetic compatibility (EMC) [10][11][12][13][14] become a primary importance during the manufacturing of the electrical and electronic circuits. The incessant technological development is currently known with systems integrating more and more different hybrid functions in a confine space.…”

Section: Introductionmentioning

confidence: 99%

Application of Near-Field Emission Processing for Microwave Circuits under Ultra-Short Duration Perturbations

Liu

Ravelo

2012

AEM

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This paper deals with the processing method of electromagnetic (EM) near-field (NF) radiated by microwave circuits with transient pulse signals. Two different NF processing methods are proposed by applying the time-frequency approach. First, a computation method of NF/NF transform is presented. This enables to calculate the EM NF maps at different distances from the radiating circuit. The feasibility of NF/NF in both frequency-and time-domain is verified with experimental results. Then, NF processing based on NF emission model implemented in UWB frequency band is also examined in the second part of the paper. For that, the number of EM NF maps representing the large band model is reduced in order to simplify the model based on a set of dipole-array. The timedomain model is implemented by considering the convolution of the transient excitation signals and the UWB dipole-array model. This time-frequency model was validated with a planar microstrip device excited by microwave signal modulating 1.25-GHz-carrier and 0.5-GHz-bandwidth. The methods explored in this paper are particularly useful for the investigation of time-domain emissions for EMC applications by considering transient EM interferences (EMIs).

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“…To forecast this unwanted phenomenon, investigations of near-field (NF) characterization were conducted [11][12][13][14][15][16][17].…”

Section: Introductionmentioning

confidence: 99%

Experimental Investigation on the Power Electronic Transistor Parameters Influence to the Near-Field Radiation for the Emc Applications

Manjombe¹,

Azzouz²,

Baudry³

et al. 2011

PIER M

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Abstract-With the increases of the module integration density and complexity in electrical and power electronic systems, serious problems related to electromagnetic interference (EMI) and electromagnetic compatibility (EMC) can occur. For the safety, these disturbing effects must be considered during the electronic equipment design process. One of the concerns on EMC problems is induced by unintentional near-field (NF) radiations. The modeling and measurement of EM NF radiations is one of the bottlenecks which must be overcome by electronic engineers. To predict the unwanted different misbehaviors caused by the EM radiation, NF test benches for the reconstitution of scanning maps at some millimeters of electrical/electronic circuits under test were developed at the IRSEEM laboratory. Due to the difficulty of the design with commercial simulators, the prediction of EM NF emitted by active electronic systems which are usually based on the use of transistors necessitates more relevant and reliable analysis techniques. For this reason, the main focus of this article is on the experimental analysis of EM NF radiated by an MOSFET transistor with changing electrical parameters. Descriptions of the experimental test bench for the EM map scan of transistors radiation are provided. This experimental setup allows not only to detect the EM NF emission but also to analyze the influence of the excitation signal parameters as the cyclic ratio. It is found that the magnetic radiation is maximal when the cyclic ratio is close to 50%. In the future, the technique introduced in this article can be used to evaluate the EM radiation of embedded electronic/electrical devices in order to improve the safety and security of electronic systems.

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TEM-cell and surface scan to identify the electromagnetic emission of integrated circuits

Cited by 14 publications

References 1 publication

Application of a Hybrid Model for the Susceptibility of Complex Form Metallic Wires Perturbed by Em Near-Field Radiated by Electronic Structures

Application of a Hybrid Model for the Susceptibility of Complex Form Metallic Wires Perturbed by Em Near-Field Radiated by Electronic Structures

Application of Near-Field Emission Processing for Microwave Circuits under Ultra-Short Duration Perturbations

Experimental Investigation on the Power Electronic Transistor Parameters Influence to the Near-Field Radiation for the Emc Applications

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