2012
DOI: 10.2528/pierb11110908
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Application of a Hybrid Model for the Susceptibility of Complex Form Metallic Wires Perturbed by Em Near-Field Radiated by Electronic Structures

Abstract: Abstract-A modeling of the metallic wires susceptibility facing to the disturbances caused by electromagnetic (EM) near-field (NF) radiated by electronic structures in radio frequencies (RF) is introduced by using a hybrid method. This latter is based on the use of the given EM-data calculated or determined from the standard computation tools associated with basic analytical methods expressing the coupling voltages at the victim wire extremities and the EM-NF radiations. In difference to the classical methods … Show more

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Cited by 9 publications
(8 citation statements)
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References 29 publications
(47 reference statements)
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“…The intense electromagnetic waves in the environment will couple strong interference signals on the cables, and then enter the terminal devices to disturb the proper functioning of the devices [1][2][3]. To suppress the interference of the ambient electromagnetic waves to the cables, the usual method of protecting the cables is adding a shielding layer.…”
Section: Introductionmentioning
confidence: 99%
“…The intense electromagnetic waves in the environment will couple strong interference signals on the cables, and then enter the terminal devices to disturb the proper functioning of the devices [1][2][3]. To suppress the interference of the ambient electromagnetic waves to the cables, the usual method of protecting the cables is adding a shielding layer.…”
Section: Introductionmentioning
confidence: 99%
“…Classical field-to-TL coupling theory has been developed and frequently used to compute the coupling of electromagnetic fields to TLs with linear terminations [3][4][5][6][7][8][9][10][11][12][13][14]. Especially, the radiated interference on printed circuit board (PCB) layout through the fieldto-TL route has become a growing concern in prediction of system reliability [15,16].…”
Section: Introductionmentioning
confidence: 99%
“…So, the EMC characterization according to the standard requirements needs to be taken into account during the design process of electronic circuits [10][11][12][13][14]. Nowadays, one of the most attractive breakthroughs concerns the nearfield (NF) couplings [15][16][17][18][19][20][21][22][23]. In addition, the determination of EM NF map is one of efficient ways in order to assure the reliability and safety of new electronic products [24][25].…”
Section: Introductionmentioning
confidence: 99%
“…So, measurement techniques and modelling methods of NF emitted by electronic systems were developed [26][27]. To study the influence of these unintentional NF emissions, susceptibility and immunity analyses were also realized [18][19][20][21][22][23]. Nevertheless, most of EMC NF characterizations are carried out in frequency-domain [7][9] [29][30][31][32][33].…”
Section: Introductionmentioning
confidence: 99%