2009
DOI: 10.1149/1.3203942
|View full text |Cite
|
Sign up to set email alerts
|

Technology Evolution of Silicon Nano-Electronics

Abstract: Silicon ultralarge-scale integrated circuits (ULSIs) are now being faced to various physical and technological limits on the scaling. In order to realize future nano-scaled complementary metal-oxidesemiconductor (CMOS) devices, the development of new materials and new functions to integrate on Si platforms and the control of variability and fluctuations of device characteristics is important.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Publication Types

Select...

Relationship

0
0

Authors

Journals

citations
Cited by 0 publications
references
References 40 publications
(73 reference statements)
0
0
0
Order By: Relevance

No citations

Set email alert for when this publication receives citations?