Technology aware design and design aware technology

Maex, Karen; Stucchi, M.; Bamal, Mandeep; Grossar, Evelyn; Dehaene, Wim; Papanikolaou, Apostolos; Miranda, M.; Catthoor, F.

doi:10.1109/icicdt.2005.1502596

Cited by 4 publications

(2 citation statements)

References 10 publications

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“…However, technology scaling has driven to couple both design and fabrication process [10]. New technologies become far less mature than earlier ones, leading to potentially less reliable products, specially under 40 nm [15].…”

Section: Introductionmentioning

confidence: 99%

Improving reliability of embedded systems through dynamic memory manager optimization using grammatical evolution

Colmenar

Risco‐Martín

Atienza

et al. 2010

Proceedings of the 12th Annual Conference on Genetic and Evolutionary Computation

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Technology scaling has offered advantages to embedded systems, such as increased performance, more available memory and reduced energy consumption. However, scaling also brings a number of problems like reliability degradation mechanisms. The intensive activity of devices and high operating temperatures are key factors for reliability degradation in latest technology nodes. Focusing on embedded systems, the memory is prone to suffer reliability problems due to the intensive use of dynamic memory on wireless and multimedia applications. In this work we present a new approach to automatically design dynamic memory managers considering reliability, and improving performance, memory footprint and energy consumption. Our approach, based on Grammatical Evolution, obtains a maximum improvement of 39% in execution time, 38% in memory usage and 50% in energy consumption over state-of-the-art dynamic memory managers for several real-life applications. In addition, the resulting distributions of memory accesses improve reliability. To the best of our knowledge, this is the first proposal for automatic dynamic memory manager design that considers reliability.

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Section: Introductionmentioning

confidence: 99%

Improving reliability of embedded systems through dynamic memory manager optimization using grammatical evolution

Colmenar

Risco‐Martín

Atienza

et al. 2010

Proceedings of the 12th Annual Conference on Genetic and Evolutionary Computation

View full text Add to dashboard Cite

show abstract

“…Reliability targets were also guaranteed at the technology level by using well controlled processes and well characterized materials. Unfortunately this "happy scaling" scenario where technology and design could be kept decoupled is coming to an end [1]. New technologies become far less mature than earlier ones, e.g.…”

Section: Introductionmentioning

confidence: 99%

Reliability Issues in Deep Deep Submicron Technologies: Time-Dependent Variability and its Impact on Embedded System Design

Papanicolaou

Miranda

Wang

et al.

IFIP International Federation for Information Processing

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Technology scaling has traditionally offered advantages to embedded systems in terms of reduced energy consumption and die cost as well as increased performance, without requiring significant additional design effort. Scaling past the 45 nm technology node, however, brings a number of problems whose impact on system level design has not been evaluated yet. Random intra-die process variability, reliability degradation mechanisms and their combined impact on the system level parametric quality metrics are prominent issues that will need to be tackled in the next few years. Dealing with these new challenges will require a paradigm shift in the system level design phase.

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Power Optimization With Power Islands Synthesis

Dal

Mansouri

2009

IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

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Technology aware design and design aware technology

Cited by 4 publications

References 10 publications

Improving reliability of embedded systems through dynamic memory manager optimization using grammatical evolution

Improving reliability of embedded systems through dynamic memory manager optimization using grammatical evolution

Reliability Issues in Deep Deep Submicron Technologies: Time-Dependent Variability and its Impact on Embedded System Design

Power Optimization With Power Islands Synthesis

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