Teaching digital test with BIST analyzer

Jutman, Artur; Tsertov, Anton; Tsepurov, Anton; Aleksejev, Igor; Ubar, Raimund; Wuttke, Heinz-Dietrich

doi:10.1109/eaeeie.2008.4610171

Cited by 2 publications

(4 citation statements)

References 4 publications

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“…The test generation tools include: (1) deterministic, genetic or random test generators for producing test sequences to be stored in the tester memory [7], (2) pseudo-random pattern generators (PRPG) for producing on-line test sequences [9][10], and (3) hybrid BIST architectures implementing the store-and-generate test concept [9][10], where the mixture of on-line pseudorandom and pre-generated deterministic test patterns are used.…”

Section: Built-in Self-test Architecturesmentioning

confidence: 99%

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A tool set for teaching design-for-testability of digital circuits

Kostin

Orasson

Ubar

2016

2016 11th European Workshop on Microelectronics Education (EWME)

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We propose a tool set for teaching and e-learning the main principles of design-for-testability technics for digital systems. It is a collection of software tools which simulate a circuit under test, emulate a pool of different strategies, methods and algorithms of self-testing and improve testability of the exercised circuit. The tools support university courses on digital electronics, testing of digital systems, design for test to learn by hands-on exercises how to design digital systems, how to make them testable, how to build self-testing systems, how to generate test patterns, how to analyze the quality of tests and how to assure the required quality by improving the testability. General ideas of organization of hands-on laboratory research are outlined. The research tasks are set up in a way that involves a competition between students, and as a consequence, motivates them to better understand the problem, and to look for best strategies of design-for-testability.

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Section: Built-in Self-test Architecturesmentioning

confidence: 99%

“…10, so that the set of all BIST sub-sessions will cover all the hard-to-test faults. As a task, synthesize an optimal BIST, using "store & generate" architecture [9] [10], and finding the proper number of seeds and the length of the pseudorandom sub-sessions achieving the 100% fault coverage.…”

Section: )mentioning

confidence: 99%

A tool set for teaching design-for-testability of digital circuits

Kostin

Orasson

Ubar

2016

2016 11th European Workshop on Microelectronics Education (EWME)

Self Cite

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show abstract

“…The test generation tools include: (1) deterministic, genetic or random test generators for producing test sequences to be stored in the tester memory [5], (2) pseudorandom test generators for producing on-line test sequences, and (3) hybrid BIST architectures implementing different store-and-generate test concepts [6]. The diagnostic response analysis possibilities are based on direct observing of the outputs, using single or multiple input signature Diagnostic tools:…”

Section: Figure 2 Gui Control Panel For Diagnozermentioning

confidence: 99%

“…The test program or test sequences can be created by many different methods: (1) as pseudorandom sequences generated on-line [6], (2) as pre-generated patterns stored in a memory [5], or (3) as a mixture of pseudorandom and pre-generated deterministic patterns [6].…”

Section: Laboratory Research Scenariosmentioning

confidence: 99%

Diagnozer: A laboratory tool for teaching research in diagnosis of electronic systems

Ubar

Jutman

Raik

et al. 2009

2009 IEEE International Conference on Microelectronic Systems Education

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In this work, we propose a multifunctional remote e-learning environment for teaching research by learning and investigating the problems of fault diagnosis in electronic systems. It is a collection of software tools which allow to simulate a system under diagnosis, emulate a pool of different methods and algorithms of fault location, analyze the efficiency of different embedded self-diagnosing architectures, and investigate the effect of real physical defects in electronic circuits. Hands-on experiments target research teaching issues. The interactive character of the environment makes the experiments attractive and helps to raise the students' curiosity for finding innovative procedures for debugging digital systems.

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Teaching digital test with BIST analyzer

Cited by 2 publications

References 4 publications

A tool set for teaching design-for-testability of digital circuits

A tool set for teaching design-for-testability of digital circuits

Diagnozer: A laboratory tool for teaching research in diagnosis of electronic systems

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