2005 International Conference on Simulation of Semiconductor Processes and Devices 2005
DOI: 10.1109/sispad.2005.201460
|View full text |Cite
|
Sign up to set email alerts
|

TCAD Challenges in the Nanotechnology Era

Abstract: TCAD process and device modeling has become an essential component of advanced technology development, delivering physical insight into processes and device operation and enabling development and optimization of technology flows. This paper highlights emerging challenges in extending these capabilities into the nanotechnology era, and the opportunities for a hierarchical, physically-based modeling approach to impact the direction of nanotechnology development.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Year Published

2006
2006
2009
2009

Publication Types

Select...
1
1

Relationship

0
2

Authors

Journals

citations
Cited by 2 publications
references
References 28 publications
0
0
0
Order By: Relevance