Targeted Partial-Shift For Mitigating Shift Switching Activity Hot-Spots During Scan Test

Holst, Stefan; Shi, Shiling; Wen, Xiaoqing

doi:10.1109/prdc47002.2019.00042

Cited by 2 publications

(1 citation statement)

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“…Only very few works, such as [26], use dynamic partitioning of scan chains on a per-pattern basis to evenly distribute peak switching activities with less impact on test time. Our previous paper first applies partial-shift in a targeted manner to only high-risk shift cycles [27]. We extend the idea to this paper for reducing peak IR-drop.…”

Section: Reduction Of Ir-drop In Scan Shiftingmentioning

confidence: 98%

GPU-Accelerated Estimation and Targeted Reduction of Peak IR-Drop during Scan Chain Shifting

SHI,

HOLST,

WEN

2023

IEICE Trans. Inf. & Syst.

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High power dissipation during scan test often causes undue yield loss, especially for low-power circuits. One major reason is that the resulting IR-drop in shift mode may corrupt test data. A common approach to solving this problem is partial-shift, in which multiple scan chains are formed and only one group of scan chains is shifted at a time. However, existing partial-shift based methods suffer from two major problems:(1) their IR-drop estimation is not accurate enough or computationally too expensive to be done for each shift cycle; (2) partial-shift is hence applied to all shift cycles, resulting in long test time. This paper addresses these two problems with a novel IR-drop-aware scan shift method, featuring: (1) Cycle-based IR-Drop Estimation (CIDE) supported by a GPU-accelerated dynamic power simulator to quickly find potential shift cycles with excessive peak IR-drop; (2) a scan shift scheduling method that generates a scan chain grouping targeted for each considered shift cycle to reduce the impact on test time. Experiments on ITC'99 benchmark circuits show that: (1) the CIDE is computationally feasible; (2) the proposed scan shift schedule can achieve a global peak IR-drop reduction of up to 47%. Its scheduling efficiency is 58.4% higher than that of an existing typical method on average, which means our method has less test time.

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Section: Reduction Of Ir-drop In Scan Shiftingmentioning

confidence: 98%