GPU-Accelerated Estimation and Targeted Reduction of Peak IR-Drop during Scan Chain Shifting
Shiling SHI,
Stefan HOLST,
Xiaoqing WEN
Abstract:High power dissipation during scan test often causes undue yield loss, especially for low-power circuits. One major reason is that the resulting IR-drop in shift mode may corrupt test data. A common approach to solving this problem is partial-shift, in which multiple scan chains are formed and only one group of scan chains is shifted at a time. However, existing partial-shift based methods suffer from two major problems:(1) their IR-drop estimation is not accurate enough or computationally too expensive to be … Show more
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