Tailless X-Ray Single-Crystal Reflection Curves Obtained by Multiple Reflection

Bonse, U.; Hart, Michael

doi:10.1063/1.1754396

Cited by 395 publications

(183 citation statements)

References 8 publications

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“…Moreover, this design is different from the double crystal diffraction technique developed by Bones and Hart. [11][12][13][14] Due to the slit geometry of the incident beam, an additional horizontal Soller collimator ͑HSC͒ is required on the scattered side ͑detector͒ in order to reduce the smearing due to vertical divergence. However, in some cases the use of an HSC is also needed on the incident side.…”

Section: Introductionmentioning

confidence: 99%

Adapting a triple-axis spectrometer for small angle neutron scattering measurements

Nieh

Yamani

Kučerka

et al. 2008

Review of Scientific Instruments

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Small angle neutron scattering (SANS) instruments typically cover a q (scattering vector) range from 0.001 to 0.6 Å−1. This range in q is achieved through a combination of cold neutrons (λ>4 Å) and a highly collimated beam. However, as a direct result of the unavailability of a cold source at the Canadian Neutron Beam Centre (CNBC), we have resorted to adapting a triple-axis spectrometer to perform SANS measurements. This is achieved through the use of multiple converging incident beams which enhance the neutron flux on the sample by a factor of 20, compared to a single beam of the same spot size. Furthermore, smearing effects due to vertical divergence from the slit geometry are reduced through the use of horizontal Soller collimators. As a result, this modified triple-axis spectrometer enables SANS measurements to a minimum q value (qmin) of ∼0.006 Å−1. Data obtained from the modified triple-axis spectrometer are in good agreement with those data from the 30 m NG3-SANS instrument located at the National Institute of Standards and Technology (Gaithersburg, MD, USA).

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Section: Introductionmentioning

confidence: 99%

Adapting a triple-axis spectrometer for small angle neutron scattering measurements

Nieh

Yamani

Kučerka

et al. 2008

Review of Scientific Instruments

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“…1 shows schematically the geometrical arrangement for high-resolution angle-resolved X-ray scattering measurements used in the present study. This arrangement is in principle the same as a small-angle X-ray scattering unit of the Bonse-Hart (1965, 1966 type. Similar schemes were also used for the measurement of diffuse scattering near a Bragg peak (Iida & Kohra, 1978, 1979 and for very-small-angle X-ray scattering experiments (Suzuki, Doi & Kohra, 1980.…”

Section: Experimental Arrangementmentioning

confidence: 99%

“…Channelcut silicon single crystals were used as collimator and analyzer, for both of which five consecutive 220 reflections of the X-ray beam (Cu K~I) took place. Such consecutive reflections make the profile of the angular window of these optical elements tailless (Bonse & Hart, 1965, 1966). An 80 pm wide vertical slit was placed between the fore crystal and the collimator crystal.…”

Section: Experimental Arrangementmentioning

confidence: 99%

High-resolution measurements of angle-resolved X-ray scattering from optically flat mirrors

Matsushita¹,

Ishikawa²,

Köhra³

1984

J Appl Cryst

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With a compact arrangement using single-crystal collimator and analyzer (silicon 220 reflection) of channel-cut type, angle-resolved scattering (ARS) curves of X-rays (Cu K~I) for optically flat mirrors have been measured at various glancing angles, 09, of X-rays to the mirror surface with an angular resolution of 4". Weak scattered intensity (10-3-10 -s of the specularly reflected beam) is observed over an angular range of a few hundred arc s below and above the direction of specular reflection. When ~o is close to the critical angle for total reflection, the scattered intensity at the low-angle tail of ARS curves is higher than that at the high-angle tail. This asymmetric tail profile of ARS curves is explained by simply superposing intensities of specularly reflected beams from surface elements inclined to each other.

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“…where /S denotes the first moment with respect to the size distribution and S(q,r) is given by Equations (12)- (16). For dense systems, the local monodisperse approximation proposed by Pedersen 51 is effective:…”

Section: Scattering Theory For Rubber-filler Systemsmentioning

confidence: 99%

“…16 Figure 2 presents a schematic picture of the USAXS instrumentation. 17 The USAXS optics consist of the monochromator and the analyzer, both of which are fabricated from either silicon or germanium.…”

Section: Neutron Scatteringmentioning

confidence: 99%

Analysis of structures of rubber-filler systems with combined scattering methods

Takenaka

2012

Polym J

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This review presents an analysis of the hierarchical structures formed in rubber-filler systems by using combined scattering methods. The combined scattering methods utilize various scattering methods and are powerful tools for the quantitative characterization of hierarchical structures over a wide range of length scales, ranging from nanometers to micrometers. Scattering theories for the analysis of the experimental scattering functions and their applications are described. Polymer Journal (2013) 45, 10-19; doi:10.1038/pj.2012.187; published online 21 November 2012Keywords: combined scattering methods; hierarchical structure; rubber-filler systems INTRODUCTION Rubber-filler systems have been widely used in industrial applications, such as for tires and belts so on. 1-6 The use of fillers in rubber compounds reinforces the rubber material and improves the barrier properties. There are several important factors for controlling the efficiency of rubber reinforcement by fillers. The dispersion of filler particles in the rubber matrix is one of the most important factors in this process. Typically, following the use of conventional compounding processes, the fillers are not dispersed homogeneously and form hierarchical structures within the rubber matrices. For example, in rubber-carbon black (CB) systems, the CB primary particles are not distributed independently but coalesce into aggregates, which are indestructible units of CB, during conventional compounding processes. 2 The aggregates of CB, which are called aggregates or agglomerates, can also lead to the formation of hierarchical structures, which consist of higher levels of ordered structure. 2 It is believed that the hierarchical structures affect the efficiency of filler reinforcement. Other rubber-filler systems also form hierarchical structures; furthermore, the characteristic lengths and morphologies of each level of ordered structure, such as agglomerates, vary with the specific combination of rubber and filler used in the system in addition to the compounding processes. To analyze the hierarchical structure, scattering techniques are one of useful techniques. In scattering experiments, we investigated the angular dependence of the scattered intensities induced by the incident beam hitting samples. Although the interpretation of the scattering intensities is complicated, nonetheless, scattering techniques are suitable for obtaining the statistical features of rubber-filler systems. However, the length scales of the hierarchical structures can extend from nanometers to micrometers, which prevents the characterization

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Tailless X-Ray Single-Crystal Reflection Curves Obtained by Multiple Reflection

Cited by 395 publications

References 8 publications

Adapting a triple-axis spectrometer for small angle neutron scattering measurements

Adapting a triple-axis spectrometer for small angle neutron scattering measurements

High-resolution measurements of angle-resolved X-ray scattering from optically flat mirrors

Analysis of structures of rubber-filler systems with combined scattering methods

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