2003
DOI: 10.1109/tsm.2003.810936
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Systems of multiple cluster tools: configuration, reliability, and performance

Abstract: The migration of semiconductor processes to singlewafer vacuum cluster tools has rendered configuration an important decision variable in fab operation and heightened the impact of reliability on fab performance. We address these closely linked issues by deriving the optimal configuration and operation of systems of cluster tools in the presence of scheduled maintenance.The two extremes in the spectrum of possible configurations are the serial configuration, in which the modules in a tool are all different, ea… Show more

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Cited by 83 publications
(22 citation statements)
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“…If the failure occurs on the processing unit holding the parity data, it can be restored at a later time while the useful data still being accessible to the users. Cluster reliability: A processing unit is considered to be in failure mode when it exhibits an abnormal behavior, in such a way that the results returned by the PU cannot be used either by the remaining PUs or by the users of the cluster [15][16][17] . The time between the detection of the error, leading to a failure and its first occurrence is called the error detection delay.…”
Section: Data Replication and Chained Desclusteringmentioning
confidence: 99%
“…If the failure occurs on the processing unit holding the parity data, it can be restored at a later time while the useful data still being accessible to the users. Cluster reliability: A processing unit is considered to be in failure mode when it exhibits an abnormal behavior, in such a way that the results returned by the PU cannot be used either by the remaining PUs or by the users of the cluster [15][16][17] . The time between the detection of the error, leading to a failure and its first occurrence is called the error detection delay.…”
Section: Data Replication and Chained Desclusteringmentioning
confidence: 99%
“…According to Kim et al, 14 the time taken for the robot to move from one step to another can be treated as the same and is much shorter than the wafer processing time. In this case, a cluster tool operates in the process-bound region such that a backward scheduling strategy is optimal for a single-arm tool 15,16 and a swap scheduling strategy is optimal for a dual-arm tool. 5 The afore-mentioned studies are conducted under the assumption that there is no constraint on the wafer sojourn time in a PM.…”
Section: Introductionmentioning
confidence: 99%
“…For cluster tools, the robot moving times from one PM to another can be treated as a constant and are much shorter than the wafer processing times [15]. Thus, backward scheduling is optimal for single-arm cluster tools [16,17]. A swap scheduling method is shown to be efficient for dual-arm cluster tools [6].…”
Section: Introductionmentioning
confidence: 99%