IEEE 9th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No.00TH8524)
DOI: 10.1109/epep.2000.895532
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Systematic development of transmission line models for interconnects with frequency-dependent losses

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Cited by 12 publications
(14 citation statements)
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“…where a, b are two points on the PCB reference (ground) plane and on the trace, respectively (see [1]), and Y (ω) is the transverse per-unit-length admittance, here computed using a 2D MoM solver [3], [4]. The incident electric field E i is defined as the externally-excited field (in present case by the radiating phone antenna) in presence of the return (ground) conductor, with the trace removed.…”
Section: Coupling Coefficientsmentioning
confidence: 99%
“…where a, b are two points on the PCB reference (ground) plane and on the trace, respectively (see [1]), and Y (ω) is the transverse per-unit-length admittance, here computed using a 2D MoM solver [3], [4]. The incident electric field E i is defined as the externally-excited field (in present case by the radiating phone antenna) in presence of the return (ground) conductor, with the trace removed.…”
Section: Coupling Coefficientsmentioning
confidence: 99%
“…Fig. 5(b) compares the result of the proposed full-wave model for the input resistance of the short-circuited differential line, calculated for frequencies from 10 MHz to 2 GHz, with that obtained from a transmission line model with per-unit-length parameters extracted using the methodology of [14] and thus accounting for frequency-dependent (skin-effect) resistance and inductance effects. The transmission-line model results serves as the reference solution in this case, since over the frequency range used for the comparison the length of the line remain below one tenth of the wavelength.…”
Section: Numerical Resultsmentioning
confidence: 98%
“…Recently, a systematic methodology [5] was presented for the development of transmission line models for interconnects with frequency-dependent parameters. The SPICE-compatible models are presented, and the finite-difference time-domain (FDTD) method is used for transient interconnect simulation…”
Section: Introductionmentioning
confidence: 99%