IEEE Trans. Electromagn. Compat.
 2022
DOI: 10.1109/temc.2022.3220651
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System-Level ESD-Induced Voltage Fluctuation to the Power of Integrated Circuits on System Board

Jian–Hsing Lee
1
,
Karuna Nidhi
2
,
Ming‐Dou Ker
3
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Cited by 3 publications
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RESURF Region Variation Induced Current Crowding Effect on HV p-LDMOS

Lee,
Li,
Nidhi
et al. 2023
2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
3
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RESURF Region Variation Induced Current Crowding Effect on HV p-LDMOS

Lee,
Li,
Nidhi
et al. 2023
2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
3
0
0
0
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A Combination of Implant Shadow and Skin Effects Leading to HV Devices Failure during the ESD Event

Lee,
Li,
Liao
et al. 2023
2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
3
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0
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The Effect of the P-Substrate Connection on the HBM Robustness of P-type ESD Device

Lee,
Liao,
Lin
et al. 2024
2024 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
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