2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) 2023
DOI: 10.1109/ipfa58228.2023.10249061
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RESURF Region Variation Induced Current Crowding Effect on HV p-LDMOS

Jian-Hsing Lee,
Ching-Ho Li,
Karuna Nidhi
et al.
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