2017
DOI: 10.1088/1748-0221/12/03/c03023
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System-level considerations for the front-end readout ASIC in the CBM experiment from the power supply perspective

Abstract: A: New fixed target experiments using high intensity beams with energy up to 10 AGeV from the SIS100 synchrotron presently being constructed at FAIR/GSI are under preparation. Most of the readout electronics and power supplies are expected to be exposed to a very high flux of nuclear reaction products and have to be radiation tolerant up to 3 MRad (TID) and sustain up to 10 14 /cm 2 of 1 MeV neutron equivalent in their life time. Moreover, the mostly minimum ionising particles under investigation leave very li… Show more

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Cited by 8 publications
(2 citation statements)
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References 19 publications
(21 reference statements)
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“…The high-frequency noise can compromise the system noise performance by increasing the ENC value. In tracking detectors, L-C filtration of the analog supplies can not be applied due to the high magnetic field in the experimental area [12]. Moreover, the linear regulators often need to be custom-designed, where radiation strengthening takes precedence over ultra-low noise performance or high PSRR.…”
Section: Jinst 14 C11030mentioning
confidence: 99%
“…The high-frequency noise can compromise the system noise performance by increasing the ENC value. In tracking detectors, L-C filtration of the analog supplies can not be applied due to the high magnetic field in the experimental area [12]. Moreover, the linear regulators often need to be custom-designed, where radiation strengthening takes precedence over ultra-low noise performance or high PSRR.…”
Section: Jinst 14 C11030mentioning
confidence: 99%
“…The presence of leakage current in detection systems is unavoidable and is related mainly to the sensor performance, some external elements, such as long cables [6], PCB fan-out and package (if used) but also to the ESD protection circuits, which in certain conditions can dominate [7]. The protection circuit is important to protect the electronics against a static discharge during the STS module assembly and partially against sparks when working with GEM detectors (in this case additional, external protection will be mandatory) [8].…”
Section: Jinst 13 T04003 2 Sources Of Leakage Current and Its Impact ...mentioning
confidence: 99%