System-Based Component-Test Plans and Operating Characteristics: Binomial Data

Easterling, Robert G.; Mazumdar, M.; Spencer, Floyd W.; Diegert, K.V.

doi:10.2307/1268781

Cited by 22 publications

(6 citation statements)

References 11 publications

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“…This criterion is referred to as the "sumrule" (see Easterling, Mazumdar, Spencer, and Diegert [4]). The total number of failures across all components is observed, and the system is accepted if this number does not exceed some value m (to be determined); otherwise, it is rejected.…”

Section: An Application To Reliability Testingmentioning

confidence: 99%

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Some Properties of the Poisson Distribution with an Application to Reliability Testing

Rajgopal

Mazumdar

Savits

1994

Prob. Eng. Inf. Sci.

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Section: An Application To Reliability Testingmentioning

confidence: 99%

“…The total number of failures across all components is observed, and the system is accepted if this number does not exceed some value m (to be determined); otherwise, it is rejected. This criterion is referred to as the "sumrule" (see Easterling, Mazumdar, Spencer, and Diegert [4]).…”

Section: An Application To Reliability Testingmentioning

confidence: 99%

Some Properties of the Poisson Distribution with an Application to Reliability Testing

Rajgopal

Mazumdar

Savits

1994

Prob. Eng. Inf. Sci.

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“…It is referred to as the M-method by Gertsbakh (1989). In addition, Easterling et al (1991) provide a justification for using the sum rule for a series system. Consider a system consisting of J subsystems where components in each subsystem j ∈ J, referred to as type j components, are identical.…”

Section: Introductionmentioning

confidence: 99%

“…In most of the models available in the literature, R(λ) is the system reliability or the probability of system survival until a predetermined time. The reader is referred to Gal (1974), Mazumdar (1977Mazumdar ( , 1980, Easterling et al (1991), Altınel (1994), Altınel andÖzekici (1997), Altınel et al (2001), and Nair and Sabnis (2002) for such models and historical developments. In a recent work, Altınel et al (2011) deviate from this fixed time-based definition of reliability and define it as the probability that the whole mission, which consists of several non-overlapping phases, is successfully completed.…”

Section: Introductionmentioning

confidence: 99%

The design of mission-based component test plans for series connection of subsystems

Altınel

Çekyay

et al. 2013

IIE Transactions

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Çekyay, Bora (Dogus Author)This article analyzes the mission-based component testing problem of devices which consist of series connection of 1-out-of-n subsystems or series connection of m-out-of-n subsystems. The device is designed to perform a mission that has a random sequence of phases with random durations. It is assumed that the deterioration of the components of the system is modulated by the mission process in such a way that the component failure rates depend on the phase that is performed. The objective is to find optimal component test times that yield desired levels of system reliability. An algorithmic procedure that is based on a column generation technique and d.c. programming is presented. This procedure eventually solves a semi-infinite linear program and it is illustrated by numerical examples. The existence of optimal component test times is discussed and sufficient conditions for the feasibility of the underlying semi-infinite linear programming model are determined

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“…This is referred to as the M method by Gertsbakh [8]. In addition, Easterling, Mazumdar, Spencer, and Diegert [6] provide a justification for using the sum rule for a series system. Using the sum rule, Mazumdar [10,11] gave solutions for the optimum component test times for a series system, and a series system with redundant subsystems when the component lifetimes are independently and exponentially distributed.…”

Section: Introductionmentioning

confidence: 99%

A dynamic model for component testing

Altınel

Özekıcı

1997

Naval Research Logistics

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We consider the component testing problem of a system where the main feature is that the component failure rates are not constant parameters, but they change in a dynamic fashion with respect to time. More precisely, each component has a piecewise‐constant failure‐rate function such that the lifetime distribution is exponential with a constant rate over local intervals of time within the overall mission time. There are several such intervals, and the rates change dynamically from one interval to another. We note that these lifetime distributions can also be used in a more general setting to approximate arbitrary lifetime distributions. The optimal component testing problem is formulated as a semi‐infinite linear program. We present an algorithmic procedure to compute optimal test times based on the column‐generation technique and illustrate it with a numerical example. © 1997 John Wiley & Sons, Inc. Naval Research Logistics 44: 187–197, 1997

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System-Based Component-Test Plans and Operating Characteristics: Binomial Data

Cited by 22 publications

References 11 publications

Some Properties of the Poisson Distribution with an Application to Reliability Testing

Some Properties of the Poisson Distribution with an Application to Reliability Testing

The design of mission-based component test plans for series connection of subsystems

A dynamic model for component testing

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