“…In addition, other diffraction peaks located at around 32.2°, 36.5°, and 49.4°are ascribed to the (001), (100), and (101) crystal plane, respectively, of the Ni 0.2 Mo 0.8 N (PDF#00-029-0931). [24][25][26][27] Regarding the XRD pattern of the NiSe 2 -NPs/NiMoN-NRs, Figure 1c shows a series of diffraction peaks appearing at 29.8°, 33.4°, 36.8°, 42.7°, 44.8°, 50.6°, 55.4°, 57.7°, and 62.1°that are associated with the (200), ( 210), ( 211), ( 220), ( 221), (311), ( 230), (321), and (400) crystal plane, respectively, of the NiSe 2 (PDF#00-041-1495), [28] confirming the successful synthesis of NiSe 2 NPs on surface of the NiMoN NRs. However, the crystalline feature of the Ni 0.2 Mo 0.8 N phase is observable with unclear weak specific signals because it is critically affected by the interference phenomenon of background noise caused by the strong intensity of multi diffraction peaks derived from the crystalline NiSe 2 phase, as similarly seen in previous reports.…”