Conditions for the formation of a Cu2SnS3 film uniform in phase composition upon annealing of a metal layer of copper and tin in sulfur vapor in a quasi-closed volume chamber using the methods of X-ray spectral microanalysis and X-ray phase analysis are presented. The rectifying heterojunction p-Cu2SnS3/n-ZnO was fabricated. PACS numbers: 81.20.−n, 61.10.Nz, 84.60.Jt