Synchrotron radiation research

Winick, H.; Doniach, Sebastian

doi:10.1116/1.571007

Cited by 14 publications

(24 citation statements)

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“…The joule= newton meters -kgm 2 /s 2 . When we have the book on the floor or [1][2][3][4][5][6][7][8][9][10][11] table, its kinetic energy will be zero. If the book falls, it will gain kinetic energy as it approaches the floor.…”

Section: 6mentioning

confidence: 99%

“…H. Charged Particle in a Magnetic Field A charged particle which moves through a magnetic field will experience a force acting upon it if the magnetic field has a component at right angles to the direction of motion of the particle. In particular, if the entire field is perpendicular to the direction of motion of the particle, the force acting on the particle will be: F = Bev, 1.22 [1][2][3][4][5][6][7][8][9][10][11][12][13][14][15][16][17][18] where B is the magnetic field strength, e is the charge on the particle, and v its velocity. The force will be perpendicular to B and to the direction of v, and the particle will tend to move in a circle of radius r (see Figure 1.5).…”

Section: Resistancementioning

confidence: 99%

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Operational health physics training

Moe¹,

Vallario²

1992

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FOREWORD For many years the Radiation Safety Technician Training Manual, ANL-7291(affectionately referred to as the "Moe Handbook"), has provided the basis for technician training throughout the nuclear industry. Though a sound document, changes in radiation protection standards and measurement technology since its publication in the early 1970's suggested that a revision would be timely.Due to our keen interest in radiation protection training, the Office of Nuclear Safety, U.S. Department of Energy, was pleased to provide support for such a revision. The end result, Operational Health Physics Training, should provide a useful reference for applied health physicists and technician training courses for years to come.We want to express our sincere appreciation to Harold Moe for his dedicated efforts in the revision to this document. It is truly a contribution to the nuclear industry. 8-288-31 8-329-1 9-1 9-5 9-5 9-8 9-11 9-12 [9][10][11][12][13][14][15] 9-17 9-19 9-22 9-23 9-24 9-24 9-27 9-28 9-309-32 4. 5.Page 13-3 13-3 13-4 13-4 13-513-613-6 13-7 13-7 13-9 13-9 13-10 13-10 13-11 13-12 13-12 13-13 . . 15-11 15-12Factor.14-1 14-1 14-? 14-314-5 14-6 14-714-8 14-8 14-11 14-1314-15 14-15 14-1614-17 . 14-19 . .14-19 . .14-21 . 14-24. .14-28 14-29. .14-33. .14-35 1-9The neutron to proton ratio (n/p) varies from about 0. The velocity of a particle is a vector quantity in which both speed and direction must be specified. The magnitude of the velocity (that is, the speed) is given in m/s in the SI system. The acceleration of a particle is defined as the time rate of change of velocity.The force F which acts on a particle is defined in terms of the product of the acceleration a and the mass m of the object:F -ma. 1.3If the acceleration is constant, 1-12The unit of charge in the SI system is the coulomb (C Figure 1.4), a negative charge appears on one plate and an equal positive charge on the other plate. In the region between the plates, an electric field exists which will exert a force on a charge placed in the field. The field strength E is defined by the force exerted on a unit charge in the field: 1-13The term potential difference, symbolized by V, is defined as the work per unit charge done in moving a charge from one plate to the other:and W -Fd -Eqd 1.10bIf W is in joules and q in coulombs, then V will be in volts. Note that the electron field strength E may also be expressed by V/d (volts/m). This is a more commonly used designation.In the parallel-plate example, the electric field E is uniform, that is, the force on a charge in the field is constant, both in direction and eV, 1MeV -106 eV and 1 GeV -109 eV.As was pointed out earlier, the movement of a charged particle produces a current.One may say that a current is simply a flow of charge.This flow can occur between parallel plates connected to a battery (see Another factor which affects electron flow in a circuit is called resistance.The resistance in the circuit influences how much current will flow. George Ohm found that in many material...

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Section: 6mentioning

confidence: 99%

Section: Resistancementioning

confidence: 99%

Operational health physics training

Moe¹,

Vallario²

1992

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“…The immediate successful use of this radiation, even in parasitic operation, resulted in an explosion of scientific interest [2]. The demand for SR in the mid-1970's led Europe, Japan and the US to construct second generation SR sources; rings fully dedicated to SR research.…”

Section: Early Sourcesmentioning

confidence: 99%

“…GENERATION SOURCES The concentration of the radiation is called the brightness, measured in photons/(s,mm 2 ,mrad 2 ,0.1%band-width). The brightness produced by a beam of electrons depends on the electron beam transverse size and divergence, the product of which is called the emittance.…”

Section: Brightness Emittance and Thirdmentioning

confidence: 99%

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Fourth generation light sources

Winick

Proceedings of the 1997 Particle Accelerator Conference (Cat. No.97CH36167)

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Concepts and designs are now being developed at laboratories around the world for light sources with performance levels that exceed present sources, including the very powerful and successful third generation synchrotron radiation sources that have come on line in the past few years. Workshops [1,2], have been held to review directions for future sources. A main thrust is to increase the brightness and coherence of the radiation using storage rings with lower electron-beam emittance or free-electron lasers (FELs). In the infra-red part of the spectrum very high brightness and coherence is already provided by FEL user facilities driven by linacs and storage rings. It now appears possible to extend FEL operation to the VUV, soft X-ray and even hard X-ray spectral range, to wavelengths down to the angstrom range, using high energy linacs equipped with high-brightness rf photoinjectors and bunch-length compressors. R&D to develop such sources is in progress at BNL, DESY, KEK, SLAC and other laboratories. In the absence of mirrors to form optical cavities, short wavelengths are reached in FEL systems in which a high peak current, low-emittance electron beam becomes bunch-density modulated at the optical wavelength in a single pass through a long undulator by self-amplified spontaneous emission (SASE); i.e.; startup from noise. A proposal to use the last kilometer of the 3 kilometer SLAC linac (the first 2 kilometers will be used for injection to the PEP II B-Factory) to provide 15 GeV electron beams to reach 1.5 Å by SASE in a 100 m long undulator is in preparation.[1] M. Cornacchia and H.

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Effects of thickness on electronic structure of titanium thin films

Akgül

2014

Bull Mater Sci

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Effects of thickness on the electronic structure of e-beam evaporated thin titanium films were studied using near-edge X-ray absorption fine structure (NEXAFS) technique at titanium L 2,3 edge in total electron yield (TEY) mode and transmission yield mode. Thickness dependence of L 2,3 branching ratio (BR) of titanium was investigated and it was found that BR below 3•5 nm shows a strong dependence on film thickness. Mean electron escape depth (λ) in titanium, an important parameter for surface applications, was determined to be λ = 2•6 ± 0•1 nm using L 2,3 resonance intensity variation as a function of film thickness. The average L 3 /L 2 white line intensity ratio of titanium was obtained as 0•89 from the ratio of amplitudes of each L 3 and L 2 peaks and 0•66 from the integrated area under each L 3 and L 2 peaks. In addition, a theoretical calculation for pure titanium was presented for comparison with experimental data.

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Synchrotron radiation research

Abstract: Research applications actuator, the scanning speed of the platform is adjustable up to approxi mately 0.25 Hz. Since the rotating and fixed beamlines are one continu

Cited by 14 publications

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Operational health physics training

Operational health physics training

Fourth generation light sources

Effects of thickness on electronic structure of titanium thin films

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