2011
DOI: 10.1080/01411594.2010.529601
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Symmetry breaking in Ni-doped PrFeO3 thin films established by Raman study

Abstract: Structural and Raman study of PrFe 1Àx Ni x O 3 (0 x 0.5) thin films deposited on LaAlO 3 substrate by Pulse laser deposition is presented. Structural analysis by X-ray diffraction shows that these films are highly epitaxial grown along the c-axis with (0 0 l) orientation and have an orthorhombic structure with space group Pbnm throughout the doping range. From Raman spectrum, a new peak starts developing at around 574 cm À1 in this system with Ni doping. However, after x ¼ 0.3 Ni concentration, there is a dec… Show more

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Cited by 7 publications
(4 citation statements)
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“…Hence, it appears that the formation of new Raman mode in the Raman spectra is possibly due to structural disorder [40,54,55]. Present results are in well agreement with earlier reports [54,[60][61][62]. In order to further confirm the appearance of Raman mode around 510 cm −1 is due to the structural disorder; laser irradiation has been carried out on pure PrFeO It is important here to note that various researchers have used laser and irradiation to produce the structural disorder [40,54,55,63].…”
Section: Systematic Correlation Between the Structural Disorder And U...supporting
confidence: 92%
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“…Hence, it appears that the formation of new Raman mode in the Raman spectra is possibly due to structural disorder [40,54,55]. Present results are in well agreement with earlier reports [54,[60][61][62]. In order to further confirm the appearance of Raman mode around 510 cm −1 is due to the structural disorder; laser irradiation has been carried out on pure PrFeO It is important here to note that various researchers have used laser and irradiation to produce the structural disorder [40,54,55,63].…”
Section: Systematic Correlation Between the Structural Disorder And U...supporting
confidence: 92%
“…As discussed in earlier section, the generation of new mode in Raman spectra with Cr doping can be due to structural disorder [54,55] or due to symmetry breaking [56,60], SXRD studies do not show any new peak due to symmetry breaking as no new peak in the diffraction patter appears or existing peak disappears even at much higher values of 2θ where the resolution of the system is much higher. Hence, it appears that the formation of new Raman mode in the Raman spectra is possibly due to structural disorder [40,54,55].…”
Section: Systematic Correlation Between the Structural Disorder And U...mentioning
confidence: 79%
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“…are technologically very important for numerous devices like piezoelectric transducer, transistor, dielectric resonator, dynamic random access memory (DRAMS), magnetic data storage devices, sensors, etc. [1,2] because of their variable structure and chemical composition [3]. Among the ideal cubic perovskite oxide materials, BaZrO 3 being a high-dielectric-constant material has been studied to replace silicon dioxide (SiO 2 ) gate insulator material of MOS transistors [4].…”
Section: Introductionmentioning
confidence: 99%