Switching fields of high-resolution magnetic force microscope tips coated with Co, Co75Pt10Cr15, Co75Pt25, and Co50Pt50films

Ishihara, Shinji; Ohtake, Mitsuru; Futamoto, Masaaki

doi:10.1051/epjconf/20147506007

Cited by 5 publications

(4 citation statements)

References 15 publications

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“…To achieve high spatial resolution and sensitivity, MFM requires specialized tips that can efficiently interact with the stray magnetic fields produced by the specimen. The most common MFM tips are non-magnetic atomic force microscopy (AFM) probes coated with a layer of a ferromagnetic material, which can be cobalt- and nickel-based alloys, magnetic multilayers and iron oxides, among others [ 17 , 18 , 19 , 20 ]. The quality of the MFM images is strongly dependent on the physical dimensions of the tip, including its size and shape, as well as its magnetic properties such as saturation magnetization, remanence, and coercivity.…”

Section: Introductionmentioning

confidence: 99%

Long-Term Performance of Magnetic Force Microscopy Tips Grown by Focused Electron Beam Induced Deposition

Escalante-Quiceno

Novotný²,

Neuman³

et al. 2023

Sensors

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High-resolution micro- and nanostructures can be grown using Focused Electron Beam Induced Deposition (FEBID), a direct-write, resist-free nanolithography technology which allows additive patterning, typically with sub-100 nm lateral resolution, and down to 10 nm in optimal conditions. This technique has been used to grow magnetic tips for use in Magnetic Force Microscopy (MFM). Due to their high aspect ratio and good magnetic behavior, these FEBID magnetic tips provide several advantages over commercial magnetic tips when used for simultaneous topographical and magnetic measurements. Here, we report a study of the durability of these excellent candidates for high-resolution MFM measurements. A batch of FEBID-grown magnetic tips was subjected to a systematic analysis of MFM magnetic contrast for 30 weeks, using magnetic storage tape as a test specimen. Our results indicate that these FEBID magnetic tips operate effectively over a long period of time. The magnetic signal was well preserved, with a maximum reduction of 60% after 21 weeks of recurrent use. No significant contrast degradation was observed after 30 weeks in storage.

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Section: Introductionmentioning

confidence: 99%

Long-Term Performance of Magnetic Force Microscopy Tips Grown by Focused Electron Beam Induced Deposition

Escalante-Quiceno

Novotný²,

Neuman³

et al. 2023

Sensors

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“…There have been many efforts to prepare MFM tips such as synthetic antiferromagnetic coating with sandwich structures 2), 3) , focused ion beam (FIB) trimming4)-6), carbon nanotubes coated with magnetic films 7), 8) . Hard magnetic coatings of Fe-Pt 9)-13) , Fe-Pd 13), 14) , Co-Pt 15)- 18) , Sm-Co 19) were used for the preparation of MFM tips to image large magnetic field. In addition to the MFM tip, the methodology of MFM itself is also critical.…”

Section: Introductionmentioning

confidence: 99%

High Coercivity and Resolution FePt•MgO-coated Tip for Imaging the Magnetic Field of Perpendicular Magnetic Write Head by Alternating Magnetic Force Microscopy (A-MFM)

Yoshimura

Yasui

et al. 2019

J. Magn. Soc. Jpn.

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High coercivity FePt•MgO films were successfully synthetized on cone-shape Si tips in a very high frequency (VHF) plasma irradiation-assisted magnetron sputtering system to prepare the MFM tips for evaluation of the AC magnetic field of perpendicular magnetic write head at high write current. Alloying with MgO significantly enhanced the coercivity of the magnetic coating due to the isolation of FePt grains by MgO. As a result, a high coercivity close to 20 kOe was achieved. The AC magnetic field images of the perpendicular magnetic write head at high write current were taken on alternating MFM (A-MFM) by this tip. A clear amplitude image with a strong signal at the main pole position was observe compared to the pure FePt layer-coated tip, which gave a blurry image and very small amplitude. Fourier analysis of the images obtained by this kind of FePt•MgO tip gives a spatial resolution of about 15 nm in air atmosphere. It is clear that the cone-shape FePt•MgO-coated MFM tip with a coercivity higher than the magnetic field to be measured is effective and capable for measuring the high AC magnetic field for an HD perpendicular magnetic write head at a very high write current.

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“…The L10-FePt film having a coercivity of more than 10 kOe has been used for the MFM tip in this case, because the magnetic field from the write head is overly strong to be able to change magnetization of an MFM tip. The development of MFM tips coated with hard magnetic materials such as Fe-Pt 12)-16) , Fe-Pd 16), 17) , Co-Pt 18)- 22) , and Sm-Co 23) were reported by several groups. However, the shape effect of the MFM tip with hard magnetic coatings has barely taken into account.…”

Section: Introductionmentioning

confidence: 99%

AC Magnetic Field Imaging of Perpendicular Magnetic Write Head without Image Distortion on Alternating Magnetic Force Microscopy using a Cone-Shape FePt-coated Tip

Yoshimura

Yasui

et al. 2018

J. Magn. Soc. Jpn.

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The AC magnetic field of a perpendicular magnetic write head having three surrounding shields was successfully imaged without image distortion on our alternating magnetic force microscope (A-MFM) using a newly developed cone-shape Si tip coated with an L10-FePt film. In contrast, a conventional quadrangular pyramidal Si tip coated with the L10-FePt film showed a distortion of the AC magnetic field image for the same magnetic write head.The image distortion depended on the spatial configuration between the tip and the write head. It is concluded that a round magnetic symmetry of the cone-shape FePt-coated tip is most effective for taking a clear AC magnetic field image of the perpendicular magnetic write head having three surrounding shields without distortion.

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Switching fields of high-resolution magnetic force microscope tips coated with Co, Co₇₅Pt₁₀Cr₁₅, Co₇₅Pt₂₅, and Co₅₀Pt₅₀films

Cited by 5 publications

References 15 publications

Long-Term Performance of Magnetic Force Microscopy Tips Grown by Focused Electron Beam Induced Deposition

Long-Term Performance of Magnetic Force Microscopy Tips Grown by Focused Electron Beam Induced Deposition

High Coercivity and Resolution FePt•MgO-coated Tip for Imaging the Magnetic Field of Perpendicular Magnetic Write Head by Alternating Magnetic Force Microscopy (A-MFM)

AC Magnetic Field Imaging of Perpendicular Magnetic Write Head without Image Distortion on Alternating Magnetic Force Microscopy using a Cone-Shape FePt-coated Tip

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