Swift heavy ion induced surface modification for tailoring coercivity in Fe–Ni based amorphous thin films

Thomas, Sabu; Thomas, Hysen; Avasthi, D.K.; Tripathi, A.; Ramanujan, R.V.; Anantharaman, M. R.

doi:10.1063/1.3075581

Cited by 52 publications

(21 citation statements)

References 40 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The R rms roughness of the as-deposited Zr surface was low at a value of 1.6 nm. This was observed to remain constant after irradiating at fluence of 5×10 12 ions/cm 2 and then increase after 1×10 13 and 5×10 The reduction in granule size could be due to the sputtering of surface structures as a result of multiple ion impacts on the surface and smoothening induced by material transport during surface diffusion at higher irradiation fluence [15]. …”

Section: Resultsmentioning

confidence: 95%

Surface and interface modification of Zr/SiC interface by swift heavy ion irradiation

Njoroge

Theron

Malherbe

et al. 2015

Nuclear Instruments and Methods in Physics Research Section B:

View full text Add to dashboard Cite

In this study thin Zr films (135 nm) were deposited on 6H-SiC substrate at room temperature by sputter deposition. ions/cm 2 . The samples were analysed before and after irradiation using Rutherford backscattering spectroscopy (RBS), atomic force microscopy (AFM) and secondary electron microscopy (SEM). The surface morphology from SEM analysis revealed a homogeneous Zr surface which did not vary with increasing fluences of irradiation. AFM analysis revealed that the R rms surface roughness did increase from the as-deposited value of 1.6 nm and then decrease at higher SHI irradiation fluences to 1.4 nm. RBS results indicate that interface mixing between Zr and SiC interface occurred and varied linearly with irradiation ion fluence. The value obtained for diffusivity of Zr shows that the mixing was due to interdiffusion across the interface during a transient melt phase according to the thermal spike model.

show abstract

Section: Resultsmentioning

confidence: 95%

Surface and interface modification of Zr/SiC interface by swift heavy ion irradiation

Njoroge

Theron

Malherbe

et al. 2015

Nuclear Instruments and Methods in Physics Research Section B:

View full text Add to dashboard Cite

show abstract

“…The electronic energy loss for SHI is, generally, about two orders of magnitude higher than the nuclear energy loss [13]. SHIs during its passage through material can cause defect annealing, cluster of point defects and columnar type of defects, phase transformation and intermixing at the interfaces [14] depending on the mass and energy of the ion and the material. Therefore, SHIs can be used for engineering the defects in the materials.…”

Section: Introductionmentioning

confidence: 99%

Heavy ion induced modifications on morphological, magnetic and magneto-transport behaviour of exchange-biased Fe/NiO and NiO/Fe bilayers with Si substrate for spintronic applications

Srivastava

2015

J Mater Sci

View full text Add to dashboard Cite

Exchange-coupled interfacial structures of Fe/ NiO and NiO/Fe with pSi substrate have been studied and also the effect of swift heavy ion irradiation on the morphological, structural, transport and magnetic behaviour is reported. The interfacial structures have been characterised from X-ray diffraction (XRD), magnetic force microscopy/ atomic force microscopy, X-ray photoelectron spectroscopy and magnetisation characteristics. XRD and X-ray photoelectron spectroscopy studies have shown the formation of various silicide and oxide phases due to the interfacial intermixing across the interfaces which is found to affect the transport and magnetic behaviour. A significant enhancement in exchange bias field and coercivity has been observed for Fe/NiO/pSi interfacial structure on the irradiation (as compared to unirradiated ones). The observed enhanced exchange bias and coercivity on the irradiation has been understood due to creation of uncompensated surface/pinned interfacial spins. Magnetic field-induced enhanced current has been observed at low temperatures (50-250 K) for the irradiated structure suggesting the spin-mixing effect. Low temperature magnetotransport study across the irradiated interface has shown negative magnetoresistance (MR) as compared to unirradiated ones for which positive MR is observed. The observed change in MR at low temperatures has been understood in terms of diffuse scattering at grain boundaries/spin-disorder scattering and/or magnetic polarons. Role of interfacial modification/changes in chemical environment across the interfaces is invoked for the observed changes in magnetic and transport behaviour of the structures. A possible explanation for the observed changes is given.

show abstract

“…Senoy et al and Hysen et al reported the fabrication of thin films from composite targets using vacuum evaporation [19,20]. They also studied annealing and swift heavy ion irradiation effects on these films and reported the formation of Fe-Ni nanocrystals with annealing [21,22]. These nanocrystalline structures precipitate after annealing at 400°C.…”

mentioning

confidence: 99%

Structural, topographical and magnetic evolution of RF-sputtered Fe-Ni alloy based thin films with thermal annealing

Lisha¹,

Thomas²,

Geetha³

et al. 2014

Mater. Res. Express

View full text Add to dashboard Cite

Metglas 2826 MB having a nominal composition of Fe 40 Ni 38 Mo 4 B 18 is an excellent soft magnetic material and finds application in sensors and memory heads. However, the thin-film forms of Fe 40 Ni 38 Mo 4 B 18 are seldom studied, although they are important in micro-electro-mechanical systems/nano-electromechanical systems devices. The stoichiometry of the film plays a vital role in determining the structural and magnetic properties of Fe 40 Ni 38 Mo 4 B 18 thin films: retaining the composition in thin films is a challenge. Thin films of 52 nm thickness were fabricated by RF sputtering technique on silicon substrate from a target of nominal composition of Fe 40 Ni 38 Mo 4 B 18 . The films were annealed at temperatures of 400°C and 600°C. The micro-structural studies of films using glancing x-ray diffractometer (GXRD) and transmission electron microscope (TEM) revealed that pristine films are crystalline with (FeNiMo) 23 B 6 phase. Atomic force microscope (AFM) images were subjected to power spectral density analysis to understand the probable surface evolution mechanism during sputtering and annealing. X-ray photoelectron spectroscopy (XPS) was employed to determine the film composition. The sluggish growth of crystallites with annealing is attributed to the presence of molybdenum in the thin film. The observed changes in magnetic properties were correlated with annealing induced structural, compositional and morphological changes.

show abstract

Swift heavy ion induced surface modification for tailoring coercivity in Fe–Ni based amorphous thin films

Cited by 52 publications

References 40 publications

Surface and interface modification of Zr/SiC interface by swift heavy ion irradiation

Surface and interface modification of Zr/SiC interface by swift heavy ion irradiation

Heavy ion induced modifications on morphological, magnetic and magneto-transport behaviour of exchange-biased Fe/NiO and NiO/Fe bilayers with Si substrate for spintronic applications

Structural, topographical and magnetic evolution of RF-sputtered Fe-Ni alloy based thin films with thermal annealing

Contact Info

Product

Resources

About