2016 IEEE International Electron Devices Meeting (IEDM) 2016
DOI: 10.1109/iedm.2016.7838524
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Sustainable electronics for nano-spacecraft in deep space missions

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Cited by 25 publications
(13 citation statements)
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“…The data can be fitted, as evident from the results presented in figure 4, to a surprising accuracy by the logpolynomial scaling function A, reflects the order of magnitude estimate (6). We note that we cannot resolve numerically whether A(v) really vanishes for > v cI I c , or if it drops to finite but exceedingly small values.…”
Section: Scaling Of the Effective Reflection Areamentioning
confidence: 82%
See 1 more Smart Citation
“…The data can be fitted, as evident from the results presented in figure 4, to a surprising accuracy by the logpolynomial scaling function A, reflects the order of magnitude estimate (6). We note that we cannot resolve numerically whether A(v) really vanishes for > v cI I c , or if it drops to finite but exceedingly small values.…”
Section: Scaling Of the Effective Reflection Areamentioning
confidence: 82%
“…• The overall mass requirements for superconducting tapes depends on the exact specification, like the material and the thickness used for the metallic substrate. Taking here the specific mass -8.9 g cm 3 of copper as a reference, we find that a wire capable to support a current of 10 6 A would weight about ( ) 8.9 5 g cm -1 length, which implies that r = 0.18 kg I m -1 . Compare (21).…”
Section: Appendix a Materials For Superconducting Wiresmentioning
confidence: 92%
“…The technical challenges involved are daunting. An example is the development of self-healing electronics [61], that is of circuits that would be capable to withstand decades to millennia of cosmic bombardment [62]. It is hence important to assess and to classify the range of possible interstellar missions.…”
Section: Discussion and Outlookmentioning
confidence: 99%
“…We i) develop a strategy for measuring HCD anneal on the chip, ii) confirm the anneal on chip and that it can be described using Stesmans' model and iii) find the anneal to strongly depend on gate bias. The results are of interest for augmenting the HCD Si-H bond breakage model [18], [19], self-healing electronics [20] and age monitoring circuits [21].…”
Section: Introductionmentioning
confidence: 94%