2002
DOI: 10.1016/s0039-6028(02)01705-3
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Surface structures of erbium silicide ultra-thin films formed by solid phase epitaxy on Si(1 0 0)

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Cited by 34 publications
(30 citation statements)
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“…A close inspection of this STM image reveals that the islands are preferably elongated in the either [1 1 0] or ½1 1 0 direction. This is reminiscence of the growth of hexagonal RE silicide nanowires on Si(0 0 1) with the epitaxial relationship of ½1 1 2 0RESi 2Àx J[1 1 0] or ½1 1 0Si [6][7][8][9][10][11][12][13][14]. As remarked above, due to a rather good lattice match along one silicide axis and a poor match along the other, the anisotropic strain of hexagonal Yb silicide can indeed favor the preferable growth along one of these Si directions.…”
Section: Resultsmentioning
confidence: 85%
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“…A close inspection of this STM image reveals that the islands are preferably elongated in the either [1 1 0] or ½1 1 0 direction. This is reminiscence of the growth of hexagonal RE silicide nanowires on Si(0 0 1) with the epitaxial relationship of ½1 1 2 0RESi 2Àx J[1 1 0] or ½1 1 0Si [6][7][8][9][10][11][12][13][14]. As remarked above, due to a rather good lattice match along one silicide axis and a poor match along the other, the anisotropic strain of hexagonal Yb silicide can indeed favor the preferable growth along one of these Si directions.…”
Section: Resultsmentioning
confidence: 85%
“…It is not clear enough whether such a structure can be compatible with AlB 2 and Th 3 Pd 5 structures found for silicon-rich Yb disilicides [21]. However, it is different from the 1 Â 1 reconstruction on the top of hexagonal Yb silicide nanowires [16] as well as the c(2 Â 2) and 2 Â 1 reconstructions on the top of other hexagonal RE silicide nanowires [8,9,[12][13][14]. Therefore, we can presume that 3D clusters crystallize in distinct structure, as compared to that of hexagonal Yb silicide nanowires.…”
Section: Article In Pressmentioning
confidence: 99%
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“…Due to its low resistivity (3.5 Â 10 À7 Om in bulk) and low schottky barrier height to Si [6,7], ErSi 2 nanowires grown on Si substrates have been studied extensively [1][2][3][4][5]8,9]. The lattice mismatch of the hexagonal type ErSi 2 in h0 0 0 1i direction (caxis) with Sih1 1 0i axis is 6.5%, and that between ErSi 2 h1 1 2 0i and Sih1 1 0i is À1.3%, respectively.…”
Section: Introductionmentioning
confidence: 99%
“…Several growth techniques have been applied, especially for the system ErSi 2 /Si(111), which has been the most extensively studied [1][2][3][4][5][6][7]. Recently the growth of thin films or nanostructures of ErSi 2 on Si(100) has also been reported [8][9][10][11].…”
Section: Introductionmentioning
confidence: 99%