“…root-mean-square roughness and correlation lengths) between the cladding and internal layer. At the outer surfaces, the distribution function g k for a phonon leaving the surface is equal to the distribution function for the phonon striking the surface multiplied by the probability of specular surface scattering p ( k , θ , η , L ) where θ is the incident angle, η is the surface roughness and L is the correlation length 36 . On the other hand, at the silicon/germanium interface, the distribution function contains contributions from reflection and transmission events with probabilities P ( k , θ , η , L ) and Q ( k , θ , η , L ), respectively 38 .…”