2019
DOI: 10.4236/wjcmp.2019.94008
|View full text |Cite
|
Sign up to set email alerts
|

Surface Recombination Concept as Applied to Determinate Silicon Solar Cell Base Optimum Thickness with Doping Level Effect

Abstract: New expressions of back surface recombination of excess minority carriers in the base of silicon solar are expressed dependent on both, the thickness and the diffusion coefficient which is in relationship with the doping rate. The optimum thickness thus obtained from the base of the solar cell allows the saving of the amount of material needed in its manufacture without reducing its efficiency.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

1
11
0
3

Year Published

2019
2019
2023
2023

Publication Types

Select...
8

Relationship

6
2

Authors

Journals

citations
Cited by 13 publications
(15 citation statements)
references
References 37 publications
(32 reference statements)
1
11
0
3
Order By: Relevance
“…As the modulation frequency increases, the density of the generated carriers decreases and is folded back to the junction [27], the optimum thickness (Hopt) decreases (in dynamic state, i.e. -The base's doping rate (Nb) [43].…”
Section: Optimum Thickness Determination Techniquementioning
confidence: 99%
“…As the modulation frequency increases, the density of the generated carriers decreases and is folded back to the junction [27], the optimum thickness (Hopt) decreases (in dynamic state, i.e. -The base's doping rate (Nb) [43].…”
Section: Optimum Thickness Determination Techniquementioning
confidence: 99%
“…The current-voltage characteristics, under constant illumination of the solar cell having different base thicknesses, are simulated and the efficiency is obtained according to the thickness and under the influence of the surface recombination velocity [31]. The influence of thickness is highlighted in dynamic regime [16] [30] [32] through the constant decay time, as well as in studies of the solar cell in 3D model [24] [33] [34] where the electrical (D, Sf, Sb) [35] [36] and geometry (grain size) [37] parameters are involved.…”
Section: Back Surface Recombination Velocity Sb (T B)mentioning
confidence: 99%
“…The phenomenological parameters to be determined are, diffusion length (L), diffusion coefficient (D), lifetime (τ), surface recombination velocities respectively at the junction (Sf) and the rear (Sb) [20] [21] [22] [23] [24]. The imposed both, thickness (H) [25] and doping rate [26] are to be take into account. The applied external conditions such as, radiation flux and energy [27], temperature and magnetic field [28] [29] [30], influence the phenomenological parameters.…”
Section: Introductionmentioning
confidence: 99%