2011
DOI: 10.1016/j.wear.2010.03.028
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Surface profilometry of high aspect ratio features

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Cited by 29 publications
(14 citation statements)
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“…) are available for examining the condition of the surface. Yet, the data collected and presented in several papers (Mathia et al ., ; Stout and Blunt, ; Lonardo et al ., ; Schwenke et al ., ; Hocken et al ., ; Hansen et al ., ; Bauza et al ., ; Mathi et al ., ) confirm that none of these measuring methods, if used alone, can give an overall picture of the surface condition. Therefore, various measuring techniques should be employed to obtain complementary information which will enable proper evaluation of results and accurate conclusions.…”
Section: Introductionmentioning
confidence: 99%
“…) are available for examining the condition of the surface. Yet, the data collected and presented in several papers (Mathia et al ., ; Stout and Blunt, ; Lonardo et al ., ; Schwenke et al ., ; Hocken et al ., ; Hansen et al ., ; Bauza et al ., ; Mathi et al ., ) confirm that none of these measuring methods, if used alone, can give an overall picture of the surface condition. Therefore, various measuring techniques should be employed to obtain complementary information which will enable proper evaluation of results and accurate conclusions.…”
Section: Introductionmentioning
confidence: 99%
“…Being capable of detecting contact and fingertip position this robotic gripper also has potential for in-situ dimensional measurement of the components of the assembly. The standing wave probes of this study have been researched as a coordinate measuring machine touch sensor and also as a scanning type probe used in surface profilometry [4,5,6]. In these studies it has been demonstrated that the dynamic force of the virtual tip (the volume encompassed by the oscillating fiber amplitude) can overcome attraction forces such as meniscus and electrostatic forces that are significant at these scales.…”
Section: Standing Wave Probe Fingertipsmentioning
confidence: 99%
“…Commercially available surface profile measurement instruments, such as scanning electron microscopes (SEMs), optical profilers, and atomic force microscopes (AFMs), encounter unsolvable difficulties in the surface profile measurement of microstructures [15][16][17][18][19][20][21]. For instance, SEMs can carry out fast measurements with a high horizontal resolution of up to nanometers [17,18,22]. However, the result obtained by SEM has limited gray scales to characterize the surface variation in the vertical direction, that is, the vertical measuring scale has a lower resolution and cannot be quantified.…”
Section: Introductionmentioning
confidence: 99%