2014
DOI: 10.1016/j.solmat.2014.04.019
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Surface potential on grain boundaries and intragrains of highly efficient Cu2ZnSn(S,Se)4 thin-films grown by two-step sputtering process

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Cited by 62 publications
(37 citation statements)
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“…Most commonly, KPFM has been used to correlate grain boundary potentials with film quality. KPFM done on reactively co-sputtered films of CZTS and CZTSSe clearly demonstrated that there exists a higher, positive surface potential at the grain boundaries and this finding was correlated with conducting AFM data showing a higher current in these same regions [26]; another study on CZTS films grown by the same method showed using conducting AFM and KPFM that the photocurrent primarily flowed along grain boundaries and capacitance microscopy [27] was used to show that the charge separation takes place at the interface of the grain boundary and grain and the current predominantly moved along these boundaries [28,29]. KPFM has also been used to detect the presence of unwanted secondary phases on the surface of CZTS films by KCN-etching [30] as well as in CZTSSe by depth profiling [31].…”
Section: Introductionmentioning
confidence: 60%
“…Most commonly, KPFM has been used to correlate grain boundary potentials with film quality. KPFM done on reactively co-sputtered films of CZTS and CZTSSe clearly demonstrated that there exists a higher, positive surface potential at the grain boundaries and this finding was correlated with conducting AFM data showing a higher current in these same regions [26]; another study on CZTS films grown by the same method showed using conducting AFM and KPFM that the photocurrent primarily flowed along grain boundaries and capacitance microscopy [27] was used to show that the charge separation takes place at the interface of the grain boundary and grain and the current predominantly moved along these boundaries [28,29]. KPFM has also been used to detect the presence of unwanted secondary phases on the surface of CZTS films by KCN-etching [30] as well as in CZTSSe by depth profiling [31].…”
Section: Introductionmentioning
confidence: 60%
“…The best carrier collection is achieved between 520 and 550 nm for all samples; in the longer wavelength region, the charge carrier collection is strictly declining. The reason might be the high number of grain boundaries that are suspected to act as recombination centers [25]. However, for CZTSSe, it was shown that larger grains do not necessarily improve the solar cell efficiency [26].…”
Section: If One Estimates the [S]/([s] + [Se]) Ratio Of Mos X Sementioning
confidence: 99%
“…In previous studies, GBs in the CIGS [47][48][49] and CZTSSe thinfilms were observed to induce downward band bending, and thus the GBs act as efficient electron and hole carrier collection region [50][51][52]. Furthermore, our group reported that a high-efficiency CZTSSe thin-film exhibits a dominant positive potential for the GBs and a negative potential at the IGs, forming downward band bending.…”
Section: Potential Distribution Of Gbs and Igs In Etched-czts Thin-filmsmentioning
confidence: 90%
“…This results in charge separation at the GBs, similar to the CIGS thin-films. Hence, electron and hole carriers are collected at some GBs, and, consequently, the current density (J SC ) and the shunt resistance are enhanced since there is a decrease in the electron-hole carrier recombination at the GBs [52].…”
Section: Potential Distribution Of Gbs and Igs In Etched-czts Thin-filmsmentioning
confidence: 99%