2015
DOI: 10.1016/j.solmat.2015.03.003
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Optical and surface probe investigation of secondary phases in Cu 2 ZnSnS 4 films grown by electrochemical deposition

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Cited by 26 publications
(8 citation statements)
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“…High equipment cost for large area deposition of thin films has made vacuum‐based approaches a poor choice. On the other hand, nonvacuum‐based fabrication methods such as chemical bath deposition, electrodeposition, spray pyrolysis, sol‐gel method, spin coating, dip coating, and SILAR have the advantage of economic and environmental cost.…”
Section: Introductionmentioning
confidence: 99%
“…High equipment cost for large area deposition of thin films has made vacuum‐based approaches a poor choice. On the other hand, nonvacuum‐based fabrication methods such as chemical bath deposition, electrodeposition, spray pyrolysis, sol‐gel method, spin coating, dip coating, and SILAR have the advantage of economic and environmental cost.…”
Section: Introductionmentioning
confidence: 99%
“…KPFM done on reactively co-sputtered films of CZTS and CZTSSe clearly demonstrated that there exists a higher, positive surface potential at the grain boundaries and this finding was correlated with conducting AFM data showing a higher current in these same regions [26]; another study on CZTS films grown by the same method showed using conducting AFM and KPFM that the photocurrent primarily flowed along grain boundaries and capacitance microscopy [27] was used to show that the charge separation takes place at the interface of the grain boundary and grain and the current predominantly moved along these boundaries [28,29]. KPFM has also been used to detect the presence of unwanted secondary phases on the surface of CZTS films by KCN-etching [30] as well as in CZTSSe by depth profiling [31].…”
Section: Introductionmentioning
confidence: 99%
“…The work functions of the two‐step‐sulfurized CIGSSe thin films with different sulfur concentrations were calculated by comparing the work functions of the tip and the sample. The work function of the sample (ϕ sample ) was obtained by subtracting the tip work function (ϕ tip ) and by using highly‐oriented pyrolytic graphite , though its value is affected by the doping and carrier concentration . V CPD is the contact potential difference of the tip and the sample, and e is the elementary charge.…”
Section: Resultsmentioning
confidence: 99%