1992
DOI: 10.1016/0039-6028(92)91391-n
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Surface photovoltage spectra and surface states of GaAs(100) with submonolayers of Cu and Pd

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Cited by 8 publications
(7 citation statements)
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“…Studies of the evolution of metal±semiconductor interfaces using SPS were pioneered by Mo Ènch et al [330] and by Brillson [323,372,373], with later studies being conducted mostly by Shapira et al [324,352,370] and Musatov et al [108,338,339,347]. An example is found in Fig.…”
Section: Gap State Spectroscopymentioning
confidence: 99%
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“…Studies of the evolution of metal±semiconductor interfaces using SPS were pioneered by Mo Ènch et al [330] and by Brillson [323,372,373], with later studies being conducted mostly by Shapira et al [324,352,370] and Musatov et al [108,338,339,347]. An example is found in Fig.…”
Section: Gap State Spectroscopymentioning
confidence: 99%
“…(2.84)), and extrapolated to zero to ®nd the threshold energy [101,108,289]. Using this approach, Musatov et al [108,338,339] have studied the coverage dependence of metal-induced surface states. They have found that in many cases the energy position of the induced states is ®xed, but in some cases it varies with coverage.…”
Section: Gap State Spectroscopymentioning
confidence: 99%
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“…Equation ͑19͒ can be compared to an expression originally derived within thermionic emission theory for current transport in metal-semiconductor contacts 24 and commonly used in the analysis of photovoltage as a function of light intensity 26,30,48…”
Section: B Steady-state Photovoltage and Its Dependence On Light Intmentioning
confidence: 99%
“…It is true that the surface photovoltage can be used to probe the non-metal to metal transition (Hamawi & Walldén 1992;D. Li et al 1992;Musatov & Smirnov 1992;Waddill et al 1990) effectively by probing the surface conductivity of the semiconductor substrate following thin film or cluster deposition. Nonetheless, conventional measures of conductivity, as well as indirect measures of surface conductivity (like the surface photovoltage), could fail to detect the non-metal to metal transition for many overlayer and thin film systems.…”
Section: Experimental Indicators (A ) Conductivitymentioning
confidence: 99%