2007
DOI: 10.1557/jmr.2007.0383
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Surface nanodeformation of discontinuously reinforced Ti composite by in situ atomic force microscope observation

Abstract: The surface nanodeformation of a discontinuously reinforced Ti-6Al-4V composite during tensile loading was investigated by in situ atomic force microscope (AFM) observation. The material used was a TiB whisker and TiC particle reinforced Ti-6Al-4V composite. The evolution of surface roughness and slip band spacing was quantified as a function of applied strain. The microstructural damage during tensile loading was also studied. The formation of slip bands within a grain of the Ti-6Al-4V matrix was clearly obse… Show more

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Cited by 5 publications
(1 citation statement)
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“…In these measurement methods, the deformation and strain localization of materials during loading can be measured using several experimental techniques at various length scales, such as the widely used strain gage technique and various full-field non-contact optical methods including interferometric methods at the macroscale [8], the scanning electron microscope (SEM) grating method [9][10][11] and electron backscatter diffraction method [12] at the micron scale, transmission electron microscopy (TEM) methods [13,14] and atomic force microscopy [15,16] at the nanoscale, and the digital image correlation (DIC) method [17]. However, these experimental investigations have been conducted within a specific length scale because of the difficulty in obtaining multiscale measurements using one specimen.…”
Section: Introductionmentioning
confidence: 99%
“…In these measurement methods, the deformation and strain localization of materials during loading can be measured using several experimental techniques at various length scales, such as the widely used strain gage technique and various full-field non-contact optical methods including interferometric methods at the macroscale [8], the scanning electron microscope (SEM) grating method [9][10][11] and electron backscatter diffraction method [12] at the micron scale, transmission electron microscopy (TEM) methods [13,14] and atomic force microscopy [15,16] at the nanoscale, and the digital image correlation (DIC) method [17]. However, these experimental investigations have been conducted within a specific length scale because of the difficulty in obtaining multiscale measurements using one specimen.…”
Section: Introductionmentioning
confidence: 99%