Development of a pattern to measure multiscale deformation and strain distribution via<i>in situ</i>FE-SEM observations

Tanaka, Yoshihisa; Naito, Kimiyoshi; Kishimoto, Seiji; Kagawa, Yutaka

doi:10.1088/0957-4484/22/11/115704

Cited by 43 publications

(16 citation statements)

References 21 publications

(22 reference statements)

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“…To overcome this difficulty, the method used herein creates a speckle pattern from a water-based solution containing ceramic particles [23]. This method presents the advantages to (i) cover the whole surface of the sample contrary to electron-beam lithography methods [24][25][26], (ii) be easily created contrary to metal loaded polymer layer methods [27,28] and (iii) keep the microstructure of the sample visible contrary to methods based on paints [21,29]. The ability to keep the microstructure visible is especially useful at the stage of creating a FE mesh of a representative volume element at the microscopic scale to compare experimental observations with numerical simulations.…”

Section: Introductionmentioning

confidence: 99%

Mechanically Regularized FE DIC for Heterogeneous Materials

Naylor

Hild

Fagiano³

et al. 2019

Exp Mech

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In situ tensile tests in a scanning electron microscope (SEM) have been conducted on a 8layer 5-harness satin carbon fibre and epoxy matrix composite to observe the first stages of damage at the scale of fibres and matrix. A speckle pattern based on a suspension of alumina particles was applied onto the surface of the specimen to facilitate the use of digital image correlation (DIC). Local and finite element (FE) DIC are compared on pictures acquired during the tensile tests, with and without a speckle pattern. FE DIC with mechanical regularization was found to be the only approach able to measure displacement fields at a fine enough resolution in both cases. This method, initially created for homogeneous materials, was then adapted to heterogeneous materials. First, a microstructure consistent mesh was created and used for correlation purposes. Second, the difference between the mechanical properties of the constituents is taken into account in the mechanical regularization. Last, the accuracy of the method is analysed. The adaptation presented herein was proved to be able to measure displacement fields in the matrix between fibres with an error of 10 nm (a fifth of a pixel) and to detect the initiation of the first damage mechanisms by means of the mechanical residuals.

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Section: Introductionmentioning

confidence: 99%

Mechanically Regularized FE DIC for Heterogeneous Materials

Naylor

Hild

Fagiano³

et al. 2019

Exp Mech

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“…The periodic gratings can be coupled with the technics like Moiré Interferometry [11] or with a specific approach like the one developed in our previous studies [8], [12]. The technics very often associated with the random gratings are Moiré interferometry and digital image correlation (DIC) [13]. In these technics, the roughness of the samples can be used in certain cases.…”

Section: Introductionmentioning

confidence: 99%

Local scale fracture characterization of an advanced structured material manufactured by fused deposition modeling in 3D printing.

Djouda

Gallittelli

Zouaoui

et al. 2019

Frattura Ed Integrità Strutturale

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Additive manufacturing (AM) is a promising way to produce complex structures by adding layers. AM arises great interest both in industrial and academic sectors to develop new advanced structured materials. To benefit from its advantages, it is important to accurately characterize the mechanical properties of the obtained structures in order to ensure their integrity during operation. It becomes important to characterize these structures at the local scale (micron and/or the nanometer scale). In the specific case of polymeric materials produced by Fused Deposition Modeling (FDM), the comprehension of the mechanical behavior between adjacent layers during deformation can help to improve mechanical properties. However, few studies in the literature have focused on implementing approaches to characterize local strains at the surface of these materials. In this study, an original approach based on the use of a speckle pattern with particles average

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“…One possible application of a multiple-beam SEM is high-speed imaging, which will be achieved by applying multiple-beam technology to an SEM system in the same manner as a lithography system. In another respect, a high-resolution SEM image with a large field of view (FOV), which has recently been demanded, 7,8 will be acquired by stitching together multiple-SEM images with a small FOV. Since the deflection-field size of each beam in a multiple-beam SEM is small, deflection aberration [which is the main cause of resolution degradation in a large-FOV image acquired by a conventional single-beam SEM (Ref.…”

Section: Introductionmentioning

confidence: 99%

Optical system for a multiple-beam scanning electron microscope

Enyama

Sakakibara

Tanimoto

et al. 2014

Journal of Vacuum Science &Amp; Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phen

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A novel optical system for a multiple-beam scanning electron microscope (SEM) is proposed. In the case of multiple-beam SEM, multiple secondary-electron beams passing through the column are inherently blurred because of the large energy spread and broad angular distribution of secondary electrons. To avoid cross-talk between the multiple secondary-electron beams, the optical system is designed such that it is divided into two independent parts: one for primary-beam illumination and one for secondary-electron detection. As the key components for the secondary-electron detection, a scan-cancelling deflector, and accelerating electric field were applied. To demonstrate the proposed optical system, a prototype column with four beams was developed. This column enables four SEM images to be separately but simultaneously acquired with more than 99% of the generated secondary electrons. This result demonstrates that high-speed imaging with the proposed multiple-beam SEM is possible in the near future.

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Development of a pattern to measure multiscale deformation and strain distribution viain situFE-SEM observations

Cited by 43 publications

References 21 publications

Mechanically Regularized FE DIC for Heterogeneous Materials

Mechanically Regularized FE DIC for Heterogeneous Materials

Local scale fracture characterization of an advanced structured material manufactured by fused deposition modeling in 3D printing.

Optical system for a multiple-beam scanning electron microscope

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