2022
DOI: 10.1016/j.physb.2022.414393
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Surface morphological and optical evolution of RF sputtered AZO films for optoelectronic devices

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Cited by 7 publications
(2 citation statements)
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“…While in the case of synthesis at 50-60 min, an increase in the γ value up to ~2.5 of is observed. Thus, the obtained values of γ, which are rather close ~2.4-2.5, indicate diffusion processes associated with the morphological evolution of CNW films [25,28].…”
Section: Resultssupporting
confidence: 53%
See 1 more Smart Citation
“…While in the case of synthesis at 50-60 min, an increase in the γ value up to ~2.5 of is observed. Thus, the obtained values of γ, which are rather close ~2.4-2.5, indicate diffusion processes associated with the morphological evolution of CNW films [25,28].…”
Section: Resultssupporting
confidence: 53%
“…The value of α for the samples synthesized at 30,40,60 min is very similar and has a value of the order of ~1.2, while for the case of 50 min it equals to ~1.3. An increase in the value of α indicates a higher surface roughness [25]. Next, fractal analysis was performed using Power Spectral Density Functions (PSDF), corresponding results are presented in logarithmic scales in Figure 2b.…”
Section: Resultsmentioning
confidence: 99%