Surface modification of polytetrafluoroethylene with tetraethoxysilane by using remote argon/dinitrogen oxide microwave plasma

Abstract

The use of remote microwave plasma for the polymerization and deposition of tetraethoxysilane on the surface of polytetrafluoroethylene was investigated using a mixture of Argon and dinitrogen oxide as carrier gas. Layers with thicknesses of 0.5-3 m were obtained, differing in chemical composition, surface energy, and flexibility/ brittleness, depending on the plasma power and both the treatment and aging times. In general, milder treatments and shorter aging times resulted in higher contents of organic structural elements in the layers and greater flexibility and surface energy. Anchoring between the layers and the bulk polytetrafluoroethylene was at least partially caused by fibrils interconnecting the two components. These results were obtained by X-ray photoelectron spectroscopy, Fourier transform infrared spectroscopy in the attenuated total reflection mode, contact angle measurements, and scanning electron microscopy combined with energy dispersive X-ray analysis.

Modification of polyethylene surface using plasma polymerization of silane

“…The band at 793 cm −1 is due to CH 3 rocking at Si(CH 3 ) 2 9. A peak at 2906 cm −1 corresponds to SiOC 2 H 5 25. It can be also seen that even for higher deposition time peaks corresponding to CH 2 stretching and bending can be seen because CH 2 is present in the structure of PPTEOS.…”

“…A peak at 1352 cm −1 corresponds to SiCH 2 Si 9. Peaks at 1421 and 1402 cm −1 corresponds to SiCH 3 25. It is clear from the ATR‐FTIR observation that TEOS is getting nicely deposited onto the PE film as compared with HMDS.…”