2012
DOI: 10.1016/j.surfcoat.2012.04.032
|View full text |Cite
|
Sign up to set email alerts
|

Surface modification of polyethylene by Ag+ and Au+ ion implantation observed by phase imaging atomic force microscopy

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2
1

Citation Types

1
24
0

Year Published

2013
2013
2023
2023

Publication Types

Select...
8

Relationship

0
8

Authors

Journals

citations
Cited by 23 publications
(25 citation statements)
references
References 23 publications
1
24
0
Order By: Relevance
“…The presence of two phases can be clearly seen; spherical particles of Sb 2 S 3 immersed in dye. A histogram obtained from AFM phase image presented in Figure c also confirms the existence of two phases (two peaks) implying that the softer phase is positioned at higher angles (right peak), which in our case is hypericin, and the harder phase positioned at lower angles (left peak), that represents spherical particles of Sb 2 S 3 . This is in agreement with the fact that hypericin is more active in the composite and serves as a the basis for incorporation of amorphous Sb 2 S 3 particles.…”
Section: Resultssupporting
confidence: 87%
“…The presence of two phases can be clearly seen; spherical particles of Sb 2 S 3 immersed in dye. A histogram obtained from AFM phase image presented in Figure c also confirms the existence of two phases (two peaks) implying that the softer phase is positioned at higher angles (right peak), which in our case is hypericin, and the harder phase positioned at lower angles (left peak), that represents spherical particles of Sb 2 S 3 . This is in agreement with the fact that hypericin is more active in the composite and serves as a the basis for incorporation of amorphous Sb 2 S 3 particles.…”
Section: Resultssupporting
confidence: 87%
“…For the sake of more reliable quantification, all scans were obtained using the same probe in order to prevent any inter-probe variability in measurements. Whereas height images display topography of the sample, the phase images reflect specific material properties of the sample~Bar et Jandt, 2001;García et al, 2007;Nenadović et al, 2012!. That is, the phase mode is based on measuring the phase shift of the cantilever, which is directly related to local changes in the energy dissipated in the sample during tip-sample interaction~Anczykowski et al, 1999; García et al, 2007;Strbac et al, 2010!. Simultaneous acquisition of height and phase images allows distinguishing between materials of different mechanical properties, enhancement of image contrast, and improvement of edge detection~Jandt, 2001!.…”
Section: Afm Analysesmentioning
confidence: 99%
“…In addition to the topographic images, their corresponding phase images have been shown in the Figures . Phase imaging reflected the phase lag of the cantilever oscillation relative to the signal sent to the cantilever's piezo driver, which can provide the information of adhesion and viscoelasticity of the surface (Liu et al ., ; Nenadović et al ., ). All phase images in Figures were corresponding well with their topographic images, which confirmed the adsorption of FA particles on mica surface.…”
Section: Resultsmentioning
confidence: 97%