Surface-induced resistivity of ultrathin metallic films: A limit law

Measurement of Electrical Resistivity of Nanostructured Platinum Thin Films and Quantum Mechanical Estimates

“…Our experimental results are compared with theoretical predictions using the quantum mechanical approach proposed by Fishman and Calecki [3,4].…”

“…In particular, it is of great importance to determine the electronic transport properties of metallic and semiconductor thin films. Since long time ago, considerable efforts have been devoted to study, for instance, the electrical conductivity σ(d) of thin films as a function of its thickness d, from the experimental and theoretical points of view [1][2][3][4][5][6][7][8][9].…”

Quantized systems with randomly corrugated walls and interfaces

“…The simplest approach is to calculate directly the matrix elements of the potential using the wave functions for flat geometry as has been suggested by Fishman and Calecki 35 for two-wall systems without interwall correlation of inhomogeneities ͑see also Ref. 36͒.…”

Quantum size effect and the two types of interference between bulk and boundary scattering in ultrathin films

“…Moreover, the perturbative approach of Ref. 23, is, probably, the simplest as long as it is justified, and has a narrower application domain than the properly applied mapping transformation, similar to that of the nonunitary mapping transformation (see Refs. 24).…”

“…Other methods to include the effects of surface roughness into the bulk Hamiltonian follow the perturbative technique of Ref. 23.…”