2004
DOI: 10.4028/www.scientific.net/jmnm.20-21.775
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Measurement of Electrical Resistivity of Nanostructured Platinum Thin Films and Quantum Mechanical Estimates

Abstract: Abstract. Nanostructured platinum thin films, with thickness going from 1.31 up to 11.66 nm, have been deposited by vacuum arc plasma. We have measured their electrical resistivity and surface roughness. The resistivity results are compared with theoretical predictions obtained using a quantum mechanical approach.

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Cited by 4 publications
(7 citation statements)
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“…12,16 The comparison between our predictions and the complete experimental data is persented in our papers. [10][11][12]17 A good agreement was found between experiment and theory.…”
Section: Surface-induced Resistivity Of Metallic and Semiconducting Tsupporting
confidence: 70%
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“…12,16 The comparison between our predictions and the complete experimental data is persented in our papers. [10][11][12]17 A good agreement was found between experiment and theory.…”
Section: Surface-induced Resistivity Of Metallic and Semiconducting Tsupporting
confidence: 70%
“…Using the Fishman and Calecki model 1,2 to explain the experimental data for Pt and Au, [10][11][12]17 we verified that the predicted ξ values obtained with their approach are in the interval 0.14 ≤ ξ ≤ 0.6 nm. These values are smaller or nearly equal to the lattice constants (∼0.4 nm) of these metals.…”
Section: Appendix Bsupporting
confidence: 57%
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“…The difference can be explained by additional contact resistances as well as the fact that the resistivity of platinum thin films is known to be higher than the bulk value. A factor of five is reported for 20 nm platinum thick films [34,35].…”
Section: Folding and Electrical Characterization Of Conductive Hingesmentioning
confidence: 91%
“…These values are higher than theoretical values of respectively (64 ± 18) Ω and (32 ± 5) Ω, calculated from the bulk value of resistivity of Platinum, ρ b = 1.06 × 10 −7 Ω m. The difference can be explained by additional contact resistances as well as the fact that the resistivity of Platinum thin films is known to be higher than the bulk value. A factor 5 is reported for 20 nm Platinum thick films [75,76]. It seems therefore likely that the resistivity is larger than the bulk value in our situation, especially for a Platinum thickness of 75 nm.…”
Section: Folding and Electrical Characterization Of Conductive Hingesmentioning
confidence: 51%