1988
DOI: 10.1021/ac00169a021
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Surface characterization of a National Bureau of Standards glass reference material by californium-252 particle desorption mass spectrometry

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Cited by 3 publications
(1 citation statement)
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“…Time-of-flight secondary ion mass spectroscopy (TOF SIMS) was achieved by bombarding silicon wafers with 252 Cf fission fragments. The mass spectrometer used in these experiments is discussed in detail elsewhere. , Both negative and positive secondary ion (SI) species were analyzed under the same experimental conditions. The bias voltage for the SI species was ±4 kV.…”
Section: Methodsmentioning
confidence: 99%
“…Time-of-flight secondary ion mass spectroscopy (TOF SIMS) was achieved by bombarding silicon wafers with 252 Cf fission fragments. The mass spectrometer used in these experiments is discussed in detail elsewhere. , Both negative and positive secondary ion (SI) species were analyzed under the same experimental conditions. The bias voltage for the SI species was ±4 kV.…”
Section: Methodsmentioning
confidence: 99%