1998
DOI: 10.1103/physrevb.58.13677
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Surface Brillouin scattering study of the surface excitations in amorphous silicon layers produced by ion bombardment

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Cited by 109 publications
(71 citation statements)
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“…In addition, numerical simulations 34 have been carried out in order to compare with experimental data. Elastic constants used in the numerical simulations are listed in Table I.…”
Section: Methodsmentioning
confidence: 99%
“…In addition, numerical simulations 34 have been carried out in order to compare with experimental data. Elastic constants used in the numerical simulations are listed in Table I.…”
Section: Methodsmentioning
confidence: 99%
“…The sagittal dependence of the scattered light intensity for In x Ga 1Àx N thin films on GaN/sapphire was simulated using the Green's function formalism developed by Zhang et al 18 The density used for In x Ga 1Àx N was interpolated from those of InN (6:81 g cm À3 ) and GaN (6:15 g cm À3 ), 5 assuming a linear dependence of the lattice parameters with composition (Vegard's law). Three different sets of elastic constants were considered in the simulations: (i) Vegard-like linear interpolation between the elastic constants of GaN and InN, (ii) quadratic parametrization of the elastic constants calculated using ab initio methods 17 with the bowing parameter corresponding to a uniform distribution of In atoms, and (iii) idem with the bowing parameter corresponding to a clustered distribution of In atoms.…”
mentioning
confidence: 99%
“…The sagittal dependence of the observed Rayleigh and Sezawa modes is analyzed by comparing with simulations based on the Green's function formalism for SAW propagation. 18 The InGaN epilayers used in this work (see Table I) were grown by plasma-assisted molecular beam epitaxy on a 4-lm thick GaN template on (0001)-sapphire substrates. Growth details and characterization of these samples have been published elsewhere.…”
mentioning
confidence: 99%
“…The calculation code, developed by Every and coworkers, 41 uses the Green's function formalism to simulate the intensity of scattered light due to the interaction of the incident light with the rippled surface. In this way, it is possible to calculate the behaviour of SAW velocity in an opaque material formed by one or more layers on a substrate as a function of the azimuthal angle and the kh product.…”
Section: Resultsmentioning
confidence: 99%