2016
DOI: 10.1016/j.actamat.2016.01.021
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Suppression of surface recombination in CuInSe2 (CIS) thin films via Trioctylphosphine Sulfide (TOP:S) surface passivation

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Cited by 14 publications
(9 citation statements)
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“…We find again that the peak maxima are at almost the same position for the different Ag concentrations, and with or without AlO x . We also find that the intensity is 3-4 times higher in the presence of the AlO x layer-this could be the effect of passivation [24]. While the PL is coming from the absorber layer, the PL yield depends on all the recombination paths.…”
Section: Opto-electrical Characterizationmentioning
confidence: 63%
“…We find again that the peak maxima are at almost the same position for the different Ag concentrations, and with or without AlO x . We also find that the intensity is 3-4 times higher in the presence of the AlO x layer-this could be the effect of passivation [24]. While the PL is coming from the absorber layer, the PL yield depends on all the recombination paths.…”
Section: Opto-electrical Characterizationmentioning
confidence: 63%
“…The PL film spectra of the raw and HT-treated QDs are shown in Figure S3. The PL intensity increased after surface treatment with HT, which indicates that the surface-defect traps were suppressed because of the passivation of the QDs. , …”
Section: Resultsmentioning
confidence: 93%
“…The PL intensity increased after surface treatment with HT, which indicates that the surface-defect traps were suppressed because of the passivation of the QDs. 21,22 The chemical composition and binding alignment of the Cldoped ZnMgO NPs were determined using XPS, as shown in Figure 2a−c. The high-resolution spectra of Zn 2p for ZnMgO NPs (Figure 2a) exhibited two main peaks at 1044.8 and 1021.1 eV, which correspond to Zn 2p 1/2 and Zn 2p 3/2 , respectively.…”
Section: ■ Results and Discussionmentioning
confidence: 99%
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