“…X-ray diffraction and Raman spectra for CZTS film can be found in our previous literature. [7,22] Following sulfurization, the amorphous TiO 2 film was deposited by radio frequency (RF) sputtering at room temperature for 60 min at 60 W. For Ga 2 O 3 -passivated samples, Ga 2 O 3 was deposited prior to TiO 2 deposition by RF magnetron sputtering at 100 W for three different deposition times, that is, 30, 60, and 90 s. The deposition was carried out at room temperature at a deposition pressure of 3 mTorr. [25] Henceforth, samples were recognized as G:0, G:30, G:60, and G:90 for CZTS/TiO 2 heterojunctions according to Ga 2 O 3 deposition time.…”