2007
DOI: 10.1007/s11434-007-0002-x
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Supercritical CO2-based solvents in next generation microelectronics processing

Abstract: Large amount of chemicals and highly purified-water are needed in microelectronic manufacture. The ability of solutions to penetrate tiny spaces will become significantly more challenging as the feature size of semiconductor devices decreases to nanoscale dimensions and the functional complexity of integrated circuitries (ICs) ever increases. Supercritical fluids (SCFs) possess a unique combination of properties (no surface tension and gas-like viscosity) that can potentially be exploited for application in mi… Show more

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Cited by 9 publications
(5 citation statements)
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References 34 publications
(28 reference statements)
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“…Although supercritical carbon dioxide processing can be viewed as a “greener” alternative to other techniques, we do not place primary focus on this point. Should SCF technology be implemented in industry, it is a welcome benefit that will follow. What is clear is that interest in the field, particularly in the area of cleaning and photoresist stripping, led to the development of full wafer process cluster tools that can be integrated into production lines. , These applications are among the most difficult for SCF carbon dioxide relative to its intrinsic physicochemical properties.…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…Although supercritical carbon dioxide processing can be viewed as a “greener” alternative to other techniques, we do not place primary focus on this point. Should SCF technology be implemented in industry, it is a welcome benefit that will follow. What is clear is that interest in the field, particularly in the area of cleaning and photoresist stripping, led to the development of full wafer process cluster tools that can be integrated into production lines. , These applications are among the most difficult for SCF carbon dioxide relative to its intrinsic physicochemical properties.…”
Section: Introductionmentioning
confidence: 99%
“…Applications development for SCF cleaning and photoresist stripping has been widely reviewed and is not the primary focus of this article. , Instead, we concentrate on areas that are particularly well-positioned to take advantage of the unique properties of SCFs to deliver significant performance improvements and in at least one case, lower cost. These processes include conformal metal and metal oxide deposition, the preparation of ultra low k dielectrics, directly patterned dielectrics, and nanostructured metal oxide films, and the design and implementation of materials and processes for high resolution lithography.…”
Section: Introductionmentioning
confidence: 99%
“…A small hysteresis is observed upon depressurization but the films shrink to the original values after the pressure goes back to ambient pressure, indicating that the pMSQ pores did not collapse in the pressurization and depressurization cycle. For the 248 nm KrF and 193 nm ArF resists, the maximum swelling was 5 or 10%, respectively, upon depressurization, the thickness of all resists return to their original thickness, indicating that CO2-based cleaning is a feasible technique for these photoresists [47,48].…”
Section: Applications Of Co 2 -Based Solvent Cleaningmentioning
confidence: 96%
“…In recent years, the traditional cleaning technology has been developing rapidly, but the microelectronics and other high-tech cleaning industry still faces many problems. As the features shrink to nano-scale, the cleaning solution contained in the acid and alkali and strong oxidizing agents can cause surface microroughness and structural deformation, aqueous cleaning is unfeasible due to surface tension and capillary forces increase [2][3][4]. Nanoporous silica (NPS) is a hotspot in ultra-low dielectric constant material domain, but highly corrosive chemical cleaning will destroy the material, the capillary force of water can also cause structural collapse [5]; The traditional cleaning has consumed a great deal of pure water and organic solvent, which inevitably caused serious environmental pollution, physical hazards and water waste.…”
Section: Introductionmentioning
confidence: 99%