We investigate the effect of the p-type top contact on the optoelectronic characteristics of light emitting diodes (LEDs) based on (In,Ga)N/GaN nanowire (NW) ensembles grown by molecular beam epitaxy on Si substrates. We compare devices fabricated with either Ni/Au or indium tin oxide (ITO) top contact. The NW-LEDs with ITO exhibit a number density of NWs emitting electroluminescence about ten times higher, significantly lower turn-on voltage and series resistance, and a relative external quantum efficiency more than one order of magnitude higher than the sample with Ni/Au. These results show that limitations in the performance of such devices reported so far can be overcome by improving the p-type top-contact.III-N nanowires (NWs) are an attractive alternative to conventional planar layers as the basis for light-emitting diodes (LEDs) 1-3 because they offer several conceptual advantages. The NW geometry enables the elastic relaxation of the strain induced by lattice mismatch at the free sidewalls, 4 thus permitting the growth of high quality (In,Ga)N/GaN heterostructures with high In content on Si substrates. Furthermore, the high aspect ratio of NWs inhibits the vertical propagation of extended defects, 5 and light extraction from arrays of NWs can be enhanced compared to planar devices. 2 In combination, these benefits could lead to cost-effective phosphorless monolithic white LEDs. 6 In practice, LEDs based on GaN NW ensembles on Si substrates have been fabricated by several groups, 1,7-14 and significant limitations in device performance have been reported. In particular, careful investigations showed that only about 1 % of the NWs in the ensemble may emit electroluminescence (EL). 8,13,15 Also, in many cases high turn-on voltages in the range of 4.5-8 V were measured, 12,13,15,16 while for more complex NW structures lower values were obtained. 12,14,17 Thus, it seems fair to say that the actual implementation of the above conceptual advantages in device performance still remains to be demonstrated. Naturally, the processing of such LEDs is rather complex because of the three-dimensional morphology of NW ensembles. Therefore, it is at present unclear whether the reported limitations are peculiar to LEDs based on NW ensembles on Si substrates or such devices simply need further advances in processing technology.One peculiarity of such NW-LEDs is that for typical device sizes they contain millions of NWs. Hence, the macroscopic LED actually consists of very many individual NWLEDs contacted in parallel, and the overall device characteristics are determined by the properties of all the individual NW-LEDs. For example, NW-to-NW fluctuations in series resistance inevitably lead to a filamentation of the current path in the NW ensemble, and this phenomenon was in fact identified as the reason for the very low fraction of electroluminescent NWs. 13 Such fluctuations in series resistance a) Author to whom correspondence should be addressed. Electronic mail: musolino@pdi-berlin.de could be caused either by non-unif...