Sub‐micron imaging of sub‐surface nanocrystalline structure in silicon

Xu, Shen; Tang, Xiaoduan; Yue, Yanan; Wang, Xinwei

doi:10.1002/jrs.4366

Cited by 13 publications

(10 citation statements)

References 15 publications

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“…The microstage shift and the out-of-focus effect induced the same trends of change in peak position, linewidth and intensity as those induced by temperature rise. They were rigorously treated and carefully removed in previous works [17,19]. The stress effect could be de-conjugated from the difference between changes in linewidth and peak position.…”

Section: Introductionmentioning

confidence: 99%

Development of time-domain differential Raman for transient thermal probing of materials

Xu¹,

Wang²,

Hurley³

et al. 2015

Opt. Express

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A novel transient thermal characterization technology is developed based on the principles of transient optical heating and Raman probing: time-domain differential Raman. It employs a square-wave modulated laser of varying duty cycle to realize controlled heating and transient thermal probing. Very well defined extension of the heating time in each measurement changes the temperature evolution profile and the probed temperature field at μs resolution. Using this new technique, the transient thermal response of a tipless Si cantilever is investigated along the length direction. A physical model is developed to reconstruct the Raman spectrum considering the temperature evolution, while taking into account the temperature dependence of the Raman emission. By fitting the variation of the normalized Raman peak intensity, wavenumber, and peak area against the heating time, the thermal diffusivity is determined as 9.17 × 10(-5), 8.14 × 10(-5), and 9.51 × 10(-5) m(2)/s. These results agree well with the reference value of 8.66 × 10(-5) m(2)/s considering the 10% fitting uncertainty. The time-domain differential Raman provides a novel way to introduce transient thermal excitation of materials, probe the thermal response, and measure the thermal diffusivity, all with high accuracy.

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Section: Introductionmentioning

confidence: 99%

Development of time-domain differential Raman for transient thermal probing of materials

Xu¹,

Wang²,

Hurley³

et al. 2015

Opt. Express

Self Cite

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“…Raman scattering is an inelastic scattering generated in laser-material interaction, and is temperature dependent in terms of peak intensity, peak shift, and peak width (full width at half maximum, FWHM) [5]. Therefore, Raman signals arising from temperature variation can be used to measure thermal properties of materials, such as in the studies of carbon nanotubes (CNTs) [6,7], graphene [8][9][10], silicon [11] and other nano-materials [12,13]. For example, Zhang's group developed a non-contact T-type Raman spectroscopy method for the simultaneous measurement of micro/nano fibers' laser absorption and thermal conductivity [14].…”

Section: Introductionmentioning

confidence: 99%

Thermal characterization of carbon nanotube fiber by time-domain differential Raman

Yue

et al. 2016

Carbon

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Most conventional Raman thermometry for thermal properties measurement is on steady-state basis, which utilizes either Joule heating effect or two lasers configurations coupled with increased complexity of system or measurement uncertainty. In this work, a new comprehensive approach including both transient and steady-state Raman method is proposed for thermal properties measurement of micro/nanowires. The transient method employs a modulated (pulsed) laser for transient heating and Raman excitation, and is termed time-domain differential Raman. The average elevated temperature during the transient heating period is probed simultaneously based on Raman thermometry. Thermal diffusivity can be readily determined by fitting normalized temperature rise against heating time with a transient heat conduction model. On the other hand, thermal conductivity can be obtained in the steady-state measurement by adjusting modulation settings. To verify this method, a carbon nanotube (CNT) fiber is measured with the thermal diffusivity of 0.20 5 0.20

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“…Xu and coworkers report submicron Raman imaging of subsurface nanocrystalline structure in silicon. They find a surprising and abnormal increase of the Raman intensity when the probing area is moved to the edge of a mechically cleaved Si wafer …”

Section: Introductionmentioning

confidence: 99%

Recent advances in linear and nonlinear Raman spectroscopy. Part VIII

Nafie

2014

J Raman Spectroscopy

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The goal of this annual review is to provide an overview of advances in the field of Raman spectroscopy as reflected in articles published each year in the Journal of Raman Spectroscopy as well as in trends across related journals that have published papers in the broad field of Raman spectroscopy. The content is obtained from statistical data on article counts obtained from Thomson Reuters ISI Web of Knowledge by year and by subfield of Raman spectroscopy. Additional information is gleaned from presentations at the XXIV International Conference on Raman Spectroscopy in Germany in August 2014 and those featuring Raman scattering at SCIX 2014 organized by the Federation of Analytical Chemistry and Spectroscopy Societies in Reno, Nevada, USA in October 2014. Coverage is also provided for topics from the conference GeoRaman 2014 held in June in St. Louis, Missouri and ECONOS 2014 held in May in Dole, France. Finally, papers published in JRS in 2013 are highlighted and arranged by topics at the frontier of Raman spectroscopy. From these various perspectives, it is clear that Raman spectroscopy is a rapidly expanding field that provides sensitive photonic information of matter at the molecular level in an ever‐widening sphere of novel applications. Copyright © 2014 John Wiley & Sons, Ltd.

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Sub‐micron imaging of sub‐surface nanocrystalline structure in silicon

Cited by 13 publications

References 15 publications

Development of time-domain differential Raman for transient thermal probing of materials

Development of time-domain differential Raman for transient thermal probing of materials

Thermal characterization of carbon nanotube fiber by time-domain differential Raman

Recent advances in linear and nonlinear Raman spectroscopy. Part VIII

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