2019
DOI: 10.1039/c9nr07590a
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Sub-10 nm tunneling field-effect transistors based on monolayer group IV mono-chalcogenides

Abstract: Optimal band gap and average effective mass of two-dimensional channels for high-performance tunneling transistors.

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Cited by 35 publications
(40 citation statements)
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“…The SS of the n-type BL-ML GeSe source homojunction TFETs and the p-type vdW GeSe/GeTe drain heterojunction TFETs are 60 and 58 mV dec -1 , respectively, which is smaller than the SS values of the ML GeTe [11], ML SnSe [9], and ML Bismuthene [10] TFETs and the required 82 mV/dec of the IRDS [43] HP devices for the year 2022 and break/equal the thermal limit of 60 mV/dec of the conventional FETs (see We then study the performances of the optimal n-type GeSe homojunction TFET and optimal p-type vdW GeSe/GeTe heterojunction TFET under a lower Vdd of 0.3~0.65 V, and the transfer characteristics are given in the bottom right panel in Figure 2 (a) and (b), respectively. We benchmark Ion, τ, and PDP of the optimal homojunction and heterojunction devices against the ML GeSe TFETs [11] and the IRDS [43] HP devices (2020 version) in Fig.…”
Section: Resultsmentioning
confidence: 75%
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“…The SS of the n-type BL-ML GeSe source homojunction TFETs and the p-type vdW GeSe/GeTe drain heterojunction TFETs are 60 and 58 mV dec -1 , respectively, which is smaller than the SS values of the ML GeTe [11], ML SnSe [9], and ML Bismuthene [10] TFETs and the required 82 mV/dec of the IRDS [43] HP devices for the year 2022 and break/equal the thermal limit of 60 mV/dec of the conventional FETs (see We then study the performances of the optimal n-type GeSe homojunction TFET and optimal p-type vdW GeSe/GeTe heterojunction TFET under a lower Vdd of 0.3~0.65 V, and the transfer characteristics are given in the bottom right panel in Figure 2 (a) and (b), respectively. We benchmark Ion, τ, and PDP of the optimal homojunction and heterojunction devices against the ML GeSe TFETs [11] and the IRDS [43] HP devices (2020 version) in Fig.…”
Section: Resultsmentioning
confidence: 75%
“…The relaxed cell lengths a/b, bandgaps Eg, and effective masses m e a , m h a , m e z , and m h z of the ML GeSe, ML GeTe, BL GeSe, and vdW GeSe/GeTe heterojunction compared with former works [11,33,35,38]. GeSe/GeTe heterojunction TFETs for HP application (Vdd = 0.74 V) compared with the ML GeSe (this work), ML GeTe [11] , ML SnS [9], ML SnSe [9], ML GeS [9], ML WTe2 [9], ML Arsenene [10], ML Antimonene [10], ML Bismuthene [10] , ML BP [7] , Vertical BP [8] TFETs and the IRDS [43] HP devices for the year 2022 (2020 version). We take Lg = 10 nm, which is smaller than the IRDS required Lg of 16 nm.…”
Section: Conflicts Of Interestmentioning
confidence: 76%
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